Photoluminescence and optical quenching of photoconductivity studies on undoped GaN grown by molecular beam epitaxy


Autoria(s): Xu HZ; Wang ZG; Harrison I; Bell A; Ansell BJ; Winser AJ; Cheng TS; Foxon CT; Kawabe M
Data(s)

2000

Resumo

Deep levels in undoped GaN materials grown by modified molecular beam epitaxy (MBE) are investigated by photoluminescence (PL) and optical quenching of photoconductivity measurements. A broad band which extends from 2.1 to 3.0 eV with a maximum at about 2.7 eV is observed, and four prominent quenching bands were found located at 2.18, 2.40, 2.71, and 2.78 eV above the valence band, respectively. These levels are attributed to four holes trap levels existence in the material. The defects cannot be firmly identified at present. (C) 2000 Elsevier Science B.V, All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/12496

http://www.irgrid.ac.cn/handle/1471x/65218

Idioma(s)

英语

Fonte

Xu HZ; Wang ZG; Harrison I; Bell A; Ansell BJ; Winser AJ; Cheng TS; Foxon CT; Kawabe M .Photoluminescence and optical quenching of photoconductivity studies on undoped GaN grown by molecular beam epitaxy ,JOURNAL OF CRYSTAL GROWTH,2000,217(3):228-232

Palavras-Chave #半导体材料 #GaN #photoluminescence #optical quenching of photoconductivity #native defect level #molecular beam epitaxy #N-TYPE GAN #DEEP-LEVEL DEFECTS #YELLOW LUMINESCENCE #MAGNETIC-RESONANCE #THIN-FILMS
Tipo

期刊论文