Effects of residual C and O impurities on photoluminescence in undoped GaN epilayers


Autoria(s): Kang JY; Shen YW; Wang ZG
Data(s)

2002

Resumo

Photoluminescence (PL) was investigated in undoped GaN from 4.8 K to room temperature. The 4.8 K spectra exhibited recombinations of free exciton, donor-acceptor pair (DAP), blue and yellow bands (Ybs). The blue band (BB) was also identified to be a DAP recombination. The YB was assigned to a recombination from deep levels. The energy-dispersive X-ray spectroscopy show that C and O are the main residual impurities in undoped GaN and that C concentration is lower in the epilayers with the stronger BB. The electronic structures of native defects, C and O impurities, and their complexes were calculated using ab initio local-density-functional (LDF) methods with linear muffin-tin-orbital and 72-atomic supercell. The theoretical analyses suggest that the electron transitions from O-N states to C-N and to V-Ga states are responsible for DAP and the BB, respectively, and the electron transitions between the inner levels of the C-N-O-N complex may be responsible for the YB in our samples. (C) 2002 Elsevier Science B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/11944

http://www.irgrid.ac.cn/handle/1471x/64942

Idioma(s)

英语

Fonte

Kang JY; Shen YW; Wang ZG .Effects of residual C and O impurities on photoluminescence in undoped GaN epilayers ,MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,2002,91(0):303-307

Palavras-Chave #半导体材料 #defects #GaN #photoluminescence #electronic structures #YELLOW LUMINESCENCE #EPITAXIAL-FILMS #MG
Tipo

期刊论文