Silicon doping induced increment of quantum dot density


Autoria(s): Duan RF; Wang BQ; Zhu ZP; Zeng Y
Data(s)

2003

Resumo

Low-indium-content self-assembled InGaAs/GaAs quantum dots (SAQD) were grown using solid-source molecular beam epitaxy (MBE) and investigated by atomic force microscopy and photoluminescence (PL) spectroscopy. Silicon, which was doped at different quantum dot (QD) growth stages, markedly increased the density of QD. We obtained high density In0.35Ga0.65As/GaAs(001) quantum dots of 10(11)/cm(2) at a growth temperature of 520degreesC. PL spectra and distribution statistics show the high quality and uniformity of our silicon-doped samples. The density increment can be explained using the lattice-hardening mechanism due to silicon doping.

Identificador

http://ir.semi.ac.cn/handle/172111/11384

http://www.irgrid.ac.cn/handle/1471x/64662

Idioma(s)

英语

Fonte

Duan RF; Wang BQ; Zhu ZP; Zeng Y .Silicon doping induced increment of quantum dot density ,JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,2003,42 (10):6314-6318

Palavras-Chave #半导体物理 #MBE #silicon #doping #density #InGaAs/GaAs #SAOD #INGAAS #ISLANDS #GAAS
Tipo

期刊论文