Pull-In Instability Of Micro-Switch Actuators: Model Review


Autoria(s): 林文惠; 赵亚溥
Data(s)

2008

Resumo

The existing three widely used pull-in theoretical models (i.e., one-dimensional lumped model, linear supposition model and planar model) are compared with the nonlinear beam mode in this paper by considering both cantilever and fixed-fixed type micro and nano-switches. It is found that the error of the pull-in parameters between one-dimensional lumped model and the nonlinear beam model is large because the denominator of the electrostatic force is minimal when the electrostatic force is computed at the maximum deflection along the beam. Since both the linear superposition model and the slender planar model consider the variation of electrostatic force with the beam's deflection, these two models not only are of the same type but also own little error of the pull-in parameters with the nonlinear beam model, the error brought by these two models attributes to that the boundary conditions are not completely satisfied when computing the numerical integration of the deflection.

Identificador

http://dspace.imech.ac.cn/handle/311007/25980

http://www.irgrid.ac.cn/handle/1471x/2490

Idioma(s)

英语

Fonte

International Journal Of Nonlinear Sciences And Numerical Simulation, 2008, 9(2): 175-183

Palavras-Chave #Pull-In #Micro And Nano-Switches #Error Estimation #Theoretical Models #Nanoscale Electrostatic Actuators #Van-Der-Waals #Variational Iteration Method #Rf Mems Switches #Torsional Actuators #Microelectromechanical Systems #Behavior #Parameters #Stability #Forces
Tipo

期刊论文