Control of Large-size SiC Growth Process Using Modeling tool

Large size bulk silicon carbide (SiC) crystals are commonly grown by the physical vapor transport (PVT) method. The PVT growth of SiC crystals involves sublimation and condensation, chemical reactions, stoichiometry, mass transport, induced thermal stress, as well as defect and micropipes generation and propagation. The quality and polytype of as-grown SiC crystals are related to the temperature distribution inside the growth chamber during the growth process, it is critical to predict the temperature distribution from the measured temperatures outside the crucible by pyrometers. A radio-frequency induction-heating furnace was used for the growth of large-size SiC crystals by the PVT method in the present study. Modeling and simulation have been used to develop the SiC growth process and to improve the SiC crystal quality. Parameters such as the temperature measured at the top of crucible, temperature measured at the bottom of the crucible, and inert gas pressure are used to control the SiC growth process. By measuring the temperatures at the top and bottom of the crucible, the temperatures inside the crucible were predicted with the help of modeling tool. SiC crystals of 6H polytype were obtained and characterized by the Raman scattering spectroscopy and SEM, and crystals of few millimeter size grown inside the crucible were found without micropipes. Expansion of the crystals were also performed with the help of modeling and simulation.

Temperature measurements with Rayotubes; a monograph on the theory, design, and use of Rayotubes.

Mode of access: Internet.

The measurement of high temperatures,

"Mr. Burgess has rewritten anew the whole book, so that it is no longer a translation, but an original work."

Thermometer and pyrometer /

Includes bibliographical references.

A probe for the measurement of high surface temperatures. [Technical report AFFDL-TR-65-121.

"This report was prepared by Cornell Aeronautical Laboratory, Inc., Buffalo, New York under USAF Contract no. AF-33(615)-1485."

High temperature heat transfer gages; high temperature thin-film resistance thermometers for heat transfer measurements.

"Conference paper. I. E. E. E. Paper no. CP 63-381."