Focused ion-beam (FIB) fabrication of micro-sized pillars for microcompression test

Pillars were fabricated by focused-ion beam (FIB) in a dual beam scanning electron microscope (SEM, FEI Quanta 3D). A multi-step milling procedure was adopted to prepare the pillars using Ga+ ion beam operated at 30 kV. The beam current was reduced from 5 nA for coarse milling down to 50 pA for fine milling, to minimize the surface damage induced by the Ga+ ion beam. The pillars were imaged at 52° tilt angle by SEM prior to the microcompression tests.

Experimental studies and modelling of the deformation behaviour of multiple nanolayers

Microcompression tests were performed on monolithic Cu and Fe thin films and a Cu/Fe multilayer that had each individual layer of 200 nm thick, to understand the mechanical behaviour of multiple nanolayers. The micron-sized pillars were prepared by focused-ion beam (FIB) technique and compressed with a flat punch in a nanoindenter. The flow curves of the monolithic Cu and Fe thin films and Cu/Fe multilayer were extracted from the microcompression tests. The monolithic Cu thin film bulges in the top region of the pillar, while the Fe thin film cracks due to its columnar grain structure. For the Cu/Fe multilayer, the ductile Cu layers accommodate the majority of plastic deformation upon compression, while cracking in the Fe layers leads to the failure of the multilayer. Finite element models of microcompression tests were also developed to provide insights into the deformation behaviours of the multilayer and monolithic thin films. © 2012 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

A Novel Range Test

In a range test, one party holds a ciphertext and needs to test whether the message encrypted in the ciphertext is within a certain interval range. In this paper, a range test protocol is proposed, where the party holding the ciphertext asks another party holding the private key of the encryption algorithm to help him. These two parties run the protocol to implement the test. The test returns TRUE if and only if the encrypted message is within the certain interval range. If the two parties do not conspire, no information about the encrypted message is revealed from the test except what can be deduced from the test result. Advantages of the new protocol over the existing related techniques are that it achieves correctness, soundness, °exibility, high e±ciency and privacy simultaneously.

Comparison of ultrafine particle release from hardcopy devices in emission test chambers and office rooms

The release of ultrafine particles (UFP) from laser printers and office equipment was analyzed using a particle counter (FMPS; Fast Mobility Particle Sizer) with a high time resolution, as well as the appropriate mathematical models. Measurements were carried out in a 1 m³ chamber, a 24 m³ chamber and an office. The time-dependent emission rates were calculated for these environments using a deconvolution model, after which the total amount of emitted particles was calculated. The total amounts of released particles were found to be independent of the environmental parameters and therefore, in principle, they were appropriate for the comparison of different printers. On the basis of the time-dependent emission rates, “initial burst” emitters and constant emitters could also be distinguished. In the case of an “initial burst” emitter, the comparison to other devices is generally affected by strong variations between individual measurements. When conducting exposure assessments for UFP in an office, the spatial distribution of the particles also had to be considered. In this work, the spatial distribution was predicted on a case by case basis, using CFD simulation.