999 resultados para Houston, Sam, 1793-1863.


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Series title also at head of t.-p.

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Mode of access: Internet.

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In the present investigation, Al2O3 thin films were deposited onto Si < 100 > substrates by DC reactive magnetron sputtering. The films were annealed in vacuum for one hour at 623, 823 and 1023 K. The composition of the films was quantitatively estimated using X-ray photoelectron spectroscopy (XPS) and the O/Al ratio was found be in the range 1.19 to 1.43. Grazing incidence X-ray diffraction (GIXRD) results revealed that the annealed films are amorphous in nature. Cross sectional transmission electron microscopy (X-TEM) analysis was carried out to study the microstructure and nature of the Al2O3-Si interface as a function of post-deposition annealing. TEM results revealed the presence of nanocrystalline gamma-Al2O3 in the annealed films and an amorphous interface layer was observed at the Al2O3 Si interface. The thickness of the amorphous interface layer was determined from the TEM analysis and the results are discussed.

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Imprint varies: 1847-55, Magdeburg, E. Baensch; [etc., etc.]--1856-58, Magdeburg und Leipzig, Gebr. Baensch.--1859-68, Leipzig, G. Graebner.

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No more published?

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Supposed to have been written by R. S. Baldwin, according to Dexter, Biog. Sketches of grads. of Yale, v.6, p. 371, and Steiner, Hist. of educ. in Conn., p. 242. Attributed to C. A. Goodrich by Cushing, Anonyms, p. 145. cf. Trinity College, Bibliog. of official pubs., 1824-1905, p. 31.

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"Aus den Abhandlungen der Königl. böhmischen gesellschaft der wisenscahften."

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Mode of access: Internet.