Griechisch-deutsches Handwörterbuch : in drei Bänden, deren dritter die griechischen Eigennamen enthält /

Bd. 1. A-K. -- Bd. 2. Omega. -- Bd. 3 Wörterbuch der griechischen Eigennamen.

Major Carl K. Hart, Lt. C.D. Vaughn & Lt. Ralph L. Bergh at a retreat on Ferry Field

On verso: Major Carl K. Hart (center), second Commanding Officer, from June 28 to August 10, 1943, with Lt. C.D. Vaughn (left), and Lt. Ralph L. Bergh. Taken at Retreat in honor of Col. F.C. Rogers, Commandant, U.S. Army Forces, University of Michigan, July 2, 1943, on Ferry Field.

Kronyka Mlado-Boleslawská od přjsstj Čechů do země České až do nyněgssjch časů pomocý rukopisů y ginych spisů a pamětj podlé lét prowedená s někternymi na mjstech swých poznamenánjmi pracý Frantisska Nowotnýho z Luže.

Mode of access: Internet.

Ueber den ersten Grundsatz der Moralphilosophie : welcher die Prüfung der bisherigen Systeme der Moral enthält ... /

1. Prüfung der Bisherigen System der Moral. -- 2. Darstellung und Prüfung des Kantischen Moralprinzips.

Lt Gen Ned Almond, USA : a ground commander's conflicting view with airmen over CAS doctrine and employment /

"August 1997."

Size-dependent radiation tolerance in ion irradiated TiN/AlN nanolayer films

Interface effects on ion-irradiation tolerance properties are investigated in nanolayered TiN/AlN films with individual layer thickness varied from 5 nm to 50 nm, prepared by pulsed laser deposition. Evolution of the microstructure and hardness of the multilayer films are examined on the specimens before and after He ion-implantation to a fluence of 4 × 10 m at 50 keV. The suppression of amorphization in AlN layers and the reduction of radiation-induced softening are observed in all nanolayer films. A clear size-dependent radiation tolerance characteristic is observed in the nanolayer films, i.e., the samples with the optimum layer thickness from 10 nm to 20 nm show the best ion irradiation tolerance properties, and a critical layer thickness of more than 5 nm is necessary to prevent severe intermixing. This study suggests that both the interface characteristics and the critical length scale (layer thickness) contribute to the reduction of the radiation-induced damages in nitride-based ceramic materials. © 2013 Elsevier B.V. All rights reserved.

Initial nucleation study and new technique for sublimation growth of AlN on SiC substrate

Single crystal platelets of AlN were successfully grown on 6H-SiC(0001) by a novel technique designed to suppress SiC decomposition, promote two-dimensional growth, and eliminate cracking in the AlN. X-ray diffractometry and synchrotron white beam X-ray topography demonstrate that the final AlN single crystal is of high structural quality.

Lt. Julia Tucker of the NYPD Rape Squad

General note: Title and date provided by Bettye Lane.