Weston-Waterville, Havre-Waterville and Waterville-Canso cables repair expeditions for the Commercial Cable Coy. : 1901-1903 : C.S.S. "Buccaneer".

On cover: no. 6.

Coaxial cable memory /

"January 10, 1957"

Disclosures on a precipitation indicator, moisture detector, vacuum ball valve, film strip printer, normal incidence interferometer, color sorter, and coaxial T. /

Mode of access: Internet.

Electrical wires and cables; catalogue and handbook, systems of wiring.

cover-title

The Central & South American cables expedition, 1893.

On cover: no. 12.

Steady State Motion of Cables in Fluids

Mode of access: Internet.

Short-circuit and ground fault analyses and location in VSC-based DC network cables

The application of high-power voltage-source converters (VSCs) to multiterminal dc networks is attracting research interest. The development of VSC-based dc networks is constrained by the lack of operational experience, the immaturity of appropriate protective devices, and the lack of appropriate fault analysis techniques. VSCs are vulnerable to dc-cable short-circuit and ground faults due to the high discharge current from the dc-link capacitance. However, faults occurring along the interconnecting dc cables are most likely to threaten system operation. In this paper, cable faults in VSC-based dc networks are analyzed in detail with the identification and definition of the most serious stages of the fault that need to be avoided. A fault location method is proposed because this is a prerequisite for an effective design of a fault protection scheme. It is demonstrated that it is relatively easy to evaluate the distance to a short-circuit fault using voltage reference comparison. For the more difficult challenge of locating ground faults, a method of estimating both the ground resistance and the distance to the fault is proposed by analyzing the initial stage of the fault transient. Analysis of the proposed method is provided and is based on simulation results, with a range of fault resistances, distances, and operational conditions considered.

Tunable coaxial resonators based on silicon optical fibers

Thermal tuning of a coaxial fiber resonator with a silica cladding surrounding an inner silicon core is investigated. By pumping the silicon with below bandgap light, it is possible to redshift the WGM resonances. © 2014 OSA.

Through wafer 3D Vertical Micro-Coaxial Probe for high frequency material characterization and millimeter wave packaging systems

This work presents the development of an in-plane vertical micro-coaxial probe using bulk micromachining technique for high frequency material characterization. The coaxial probe was fabricated in a silicon substrate by standard photolithography and a deep reactive ion etching (DRIE) technique. The through-hole structure in the form of a coaxial probe was etched and metalized with a diluted silver paste. A co-planar waveguide configuration was integrated with the design to characterize the probe. The electrical and RF characteristics of the coaxial probe were determined by simulating the probe design in Ansoft's High Frequency Structure Simulator (HFSS). The reflection coefficient and transducer gain performance of the probe was measured up to 65 GHz using a vector network analyzer (VNA). The probe demonstrated excellent results over a wide frequency band, indicating its ability to integrate with millimeter wave packaging systems as well as characterize unknown materials at high frequencies. The probe was then placed in contact with 3 materials where their unknown permittivities were determined. To accomplish this, the coaxial probe was placed in contact with the material under test and electromagnetic waves were directed to the surface using the VNA, where its reflection coefficient was then determined over a wide frequency band from dc-to -65GHz. Next, the permittivity of each material was deduced from its measured reflection coefficients using a cross ratio invariance coding technique. The permittivity results obtained when measuring the reflection coefficient data were compared to simulated permittivity results and agreed well. These results validate the use of the micro-coaxial probe to characterize the permittivity of unknown materials at high frequencies up to 65GHz.