The sensitivity of mapping methods to reference data quality:training supervised image classifications with imperfect reference data

The accuracy of a map is dependent on the reference dataset used in its construction. Classification analyses used in thematic mapping can, for example, be sensitive to a range of sampling and data quality concerns. With particular focus on the latter, the effects of reference data quality on land cover classifications from airborne thematic mapper data are explored. Variations in sampling intensity and effort are highlighted in a dataset that is widely used in mapping and modelling studies; these may need accounting for in analyses. The quality of the labelling in the reference dataset was also a key variable influencing mapping accuracy. Accuracy varied with the amount and nature of mislabelled training cases with the nature of the effects varying between classifiers. The largest impacts on accuracy occurred when mislabelling involved confusion between similar classes. Accuracy was also typically negatively related to the magnitude of mislabelled cases and the support vector machine (SVM), which has been claimed to be relatively insensitive to training data error, was the most sensitive of the set of classifiers investigated, with overall classification accuracy declining by 8% (significant at 95% level of confidence) with the use of a training set containing 20% mislabelled cases.

Modelling and studies of the spectral response of some optoelectronic components

Solar radiation takes in today's world, an increasing importance. Different devices are used to carry out spectral and integrated measurements of solar radiation. Thus the sensors can be divided into the fallow types: Calorimetric, Thermomechanical, Thermoelectric and Photoelectric. The first three categories are based on components converting the radiation to temperature (or heat) and then into electrical quantity. On the other hand, the photoelectric sensors are based on semiconductor or optoelectronic elements that when irradiated change their impedance or generate a measurable electric signal. The response function of the sensor element depends not only on the intensity of the radiation but also on its wavelengths. The radiation sensors most widely used fit in the first categories, but thanks to the reduction in manufacturing costs and to the increased integration of electronic systems, the use of the photoelectric-type sensors became more interesting. In this work we present a study of the behavior of different optoelectronic sensor elements. It is intended to verify the static response of the elements to the incident radiation. We study the optoelectronic elements using mathematical models that best fit their response as a function of wavelength. As an input to the model, the solar radiation values are generated with a radiative transfer model. We present a modeling of the spectral response sensors of other types in order to compare the behavior of optoelectronic elements with other sensors currently in use.