995
resultados para
POROUS SILICON LUMINESCENCE
Publicadores
Filtro por publicador
Aberystwyth University Repository - Reino Unido (2)
AMS Tesi di Dottorato - Alm@DL - Università di Bologna (1)
Archivo Digital para la Docencia y la Investigación - Repositorio Institucional de la Universidad del País Vasco (3)
Aston University Research Archive (3)
Biblioteca Digital da Produção Intelectual da Universidade de São Paulo (3)
Biblioteca Digital da Produção Intelectual da Universidade de São Paulo (BDPI/USP) (3)
BORIS: Bern Open Repository and Information System - Berna - Suiça (1)
CaltechTHESIS (17)
Cambridge University Engineering Department Publications Database (278)
Chinese Academy of Sciences Institutional Repositories Grid Portal (253)
Cochin University of Science & Technology (CUSAT), India (1)
CORA - Cork Open Research Archive - University College Cork - Ireland (3)
Digital Commons - Michigan Tech (3)
Digital Commons at Florida International University (1)
DigitalCommons@The Texas Medical Center (1)
Diposit Digital de la UB - Universidade de Barcelona (1)
DRUM (Digital Repository at the University of Maryland) (1)
eResearch Archive - Queensland Department of Agriculture; Fisheries and Forestry (2)
Helda - Digital Repository of University of Helsinki (7)
Indian Institute of Science - Bangalore - Índia (253)
INSTITUTO DE PESQUISAS ENERGÉTICAS E NUCLEARES (IPEN) - Repositório Digital da Produção Técnico Científica - BibliotecaTerezine Arantes Ferra (2)
QUB Research Portal - Research Directory and Institutional Repository for Queen's University Belfast (4)
Queensland University of Technology - ePrints Archive (145)
Repositório Institucional da Universidade de Aveiro - Portugal (1)
Repositório Institucional UNESP - Universidade Estadual Paulista "Julio de Mesquita Filho" (3)
Universidad de Alicante (1)
Universitat de Girona, Spain (1)
University of Queensland eSpace - Australia (1)
Design of a
silicon
microsensor array device for gas analysis
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Atomic structure, band offsets and hydrogen in high K oxide :
silicon
interfaces
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CHARACTERIZATION OF ELECTRONIC AND STRUCTURAL-PROPERTIES OF THIN
SILICON
DIOXIDE FILMS BY SCANNED PROBE MICROSCOPY
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Nanocrystalline
Silicon
Thin Films Fabricated at 80 degrees C by Using Electron Cyclotron Resonance Chemical Vapor Deposition
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PERFORMANCE OF CMOS DEVICES IN
SILICON
-ON-SAPPHIRE FILMS AFTER SOLID-PHASE EPITAXIAL-GROWTH WITH RAPID ELECTRON-BEAM HEATING
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