Image reconstruction by an alternating minimisation

This paper focuses on the problem of incomplete data in the applications of the circular cone-beam computed tomography. This problem is frequently encountered in medical imaging sciences and some other industrial imaging systems. For example, it is crucial when the high density region of objects can only be penetrated by X-rays in a limited angular range. As the projection data are only available in an angular range, the above mentioned incomplete data problem can be attributed to the limited angle problem, which is an ill-posed inverse problem. This paper reports a modified total variation minimisation method to reduce the data insufficiency in tomographic imaging. This proposed method is robust and efficient in the task of reconstruction by showing the convergence of the alternating minimisation method. The results demonstrate that this new reconstruction method brings reasonable performance. (C) 2010 Elsevier B.V. All rights reserved.

GIUSAXS and AFM Studies on Surface Reconstruction of Latex Thin Films during Thermal Treatment

The structural evolution of a single-layer latex film during annealing was studied via grazing incidence ultrasmall-angle X-ray scattering (GIUSAXS) and atomic force microscopy (AFM). The latex particles were composed of a low-T-g (-54 degrees C) core (n-butylacrylate, 30 wt %) and a high-T-g (41 degrees C) shell (t-butylacrylate, 70 wt %) and had an overall diameter of about 500 nm. GIUSAXS data indicate that the q(y) scan at q(z) = 0.27 nm(-1) (out-of-plane scan) contains information about both the structure factor and the form factor. The GIUSAXS data on latex films annealed at various temperatures ranging from room temperature to 140 degrees C indicate that the structure of the latex thin film beneath the surface changed significantly. The evolution of the out-of-plane scan plot reveals the surface reconstruction of the film. Furthermore, we also followed the time-dependent behavior of structural evolution when the latex film was annealed at a relatively low temperature (60 degrees C) where restructuring within the film can be followed that cannot be detected by AFM, which detects only surface morphology.