Los linajes de Bizkaia en la Baja Edad Media: poder, parentesco y conflicto

Este libro se ocupa del principal protagonista de la historia medieval de Bizkaia: el hidalgo. Como en el resto de Europa Occidental, la nobleza del Señorío, organizada social y políticamente en linajes, acapara las fuentes de renta y traza sus estrategias sobre la alianza y la violencia. Sin embargo, en Bizkaia, la violencia feudal alcanzará cotas extremas en lo que se conoce como "luchas de bandos". La competencia entre los hidalgos se fundamenta en un argumento tan sólido como simple: el "más valer". "Más valer" en rentas y atreguados, "más valer" en descendencia bastarda o legítima, "más valer" que mueve a matar al vecino como forma extrema de sometimiento. En este contexto el linaje destaca como una referencia existencial paralela a tan extrema ideología de la competencia. En él se desarrolla la vida, se revelan los signos del poder y se conforma la imagen propia sobre la de los antepasados. Al filo del 1500, esta manifestación local de la honra tendrá tal éxito que contagiará al resto de los vizcaínos de la época forzando la implantación de la "hidalguía universal"

Optical parameters and absorption of copper (II)-azo complexes thin films as optical recording media

Smooth thin films of three kinds of azo dyes of 2-(5'-tert-butyl-3'-azoxylisoxazole)-1, 3-diketones and their copper (II)-azo complexes were prepared by the spin-coating method. Absorption spectra of the thin films on a glass substrate in the 300-600 nm wavelength region were measured. Optical constants (complex refractive index N=n+ik) and thickness of the thin films prepared on single-crystal silicon substrate in the 300-600 nm wavelength region were investigated on rotating analyzer-polarizer type of scanning ellipsometer, and dielectric constants epsilon(epsilon=epsilon(1)+i epsilon(2)), absorption coefficients alpha as well as reflectance R of thin films were then calculated. In addition, one of the copper (II)-azo complex thin film prepared on glass substrate with an Ag reflective layer was also studied by atomic force microscopy (AFM) and static optical recording. AFM study shows that the copper (II)-azo complex thin film is very smooth and has a root mean square surface roughness of 1.89 nm. Static optical recording shows that the recording marks on the copper (II)-azo complex thin film are very clear and circular, and the size of the minimal recording marks can reach 200 nm. (c) 2004 Elsevier B.V. All rights reserved.

Optical properties of nickel(II)-azo complexes thin films for potential application as high-density recordable optical recording media

Smooth thin films of three kinds of nickel(II)-azo complexes were prepared by the spin-coating method. Absorption spectra of the thin films on K9 glass substrate in the 300-600 nn wavelength region were measured. Optical constants (complex refractive index N = n + ik) and thickness of the thin films prepared on single-crystal silicon substrate in the 300-600 nm wavelength region were investigated on rotating analyzer-polarizer type of scanning ellipsometer, and dielectric constants epsilon (epsilon = epsilon(1) + i epsilon(2)), absorption coefficients a as well as reflectance R of thin films were then calculated at 405 nm. In addition, in order to examine the possible use of nickel(II)-azo complex thin film as an optical recording medium, one of the nickel(II)-azo complex thin film prepared on K9 glass substrate with an Ag reflective layer was also studied by atomic force microscopy and static optical recording. The results show that the nickel(II)-azo complex thin film is smooth and has a root mean square surface roughness of 2.25 nm, and the recording marks on the nickel(II)-azo complex thin film are very clear and circular, and their size can reach 200 nn or less. (c) 2006 Elsevier Ltd. All rights reserved.