915 resultados para polarization holographic optical recording


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We investigate the use of beam polarisation as well as nal state polarisation efects in probing the interaction of the Higgs boson with a pair of heavy vector bosons in the process e+e! ffH, where f is any light fermion. The sensitivity of the International Linear Collider (ILC) operating at ps = 500 GeV, to such V V H(V = W=Z) couplings is examined in a model independent way. The efects of ISR and beamstrahlung are discussed.

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Silicon oxide films were deposited by reactive evaporation of SiO. Parameters such as oxygen partial pressure and substrate temperature were varied to get variable and graded index films. Films with a refractive index in the range 1.718 to 1.465 at 550 nm have been successfully deposited. Films deposited using ionized oxygen has the refractive index 1.465 at 550 nm and good UV transmittance like bulk fused quartz. Preparation of graded index films was also investigated by changing the oxygen partial pressure during deposition. A two layer antireflection coating at 1064nm has been designed using both homogeneous and inhomogeneous films and studied their characteristics.

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In phase-encoded optical CDMA (OCDMA) spreading is achieved by encoding the phase of signal spectrum. Here, a mathematical model for the output signal of a phase-encoded OCDMA system is first derived. This is shown to lead to a performance metric for the design of spreading sequences for asynchronous transmission. Generalized bent functions are used to construct a family of efficient phase-encoding sequences. It is shown how M-ary modulation of these spreading sequences is possible. The problem of designing efficient phaseencoded sequences is then related to the problem of minimizing PMEPR (peak-to-mean envelope power ratio) in an OFDM communication system.

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TiO2 thin films were prepared by sol gel method. The structural investigations performed by means of X- ray diffraction (XRD) technique, Scanning electronic microscopy (SEM) showed the shape structure at T=600°C. The optical constants of the deposited film were obtained from the analysis of the experimental recorded transmittance spectral data over the wavelengths range 200-3000 nm. The values of some important parameters (refractive index n, dielectric constant ε ∞ and thickness d), and the third order optical nonlinear susceptibility χ(3) of TiO2 film are determined from these spectra. It has been found that the dispersion data obey the single oscillator relation of the Wemple-DiDomenico model, from which the dispersion parameters and high – frequency dielectric constant were determined. The estimation of the corresponding band gap Eg , χ (3) and ε ∞ are 2.57 eV, 0.021 × 10-10 esu and 5.20,respectively.