IDENTIFICATION OF THE ENERGY-LEVELS OF SI-RH

Two thermostable levels E(0.31) and E(0.58) related to Rh in Si were observed using deep level transient spectroscopy and double correlation deep level transient spectroscopy techniques. By means of thermal annealing and electron irradiation, the microscopic natures of these levels were identified for the first time. The levels E(0.31) and E(0.58) arise from by the same impurity center but have different charge states. Their microstructures are not related to a pure substitutional Rh atom, but correspond to a complex. This result is compared to our self-consistent theoretical calculation.

Architecture research and hardware implementation on simplified neural computing system for face identification

This paper describes a special-purpose neural computing system for face identification. The system architecture and hardware implementation are introduced in detail. An algorithm based on biomimetic pattern recognition has been embedded. For the total 1200 tests for face identification, the false rejection rate is 3.7% and the false acceptance rate is 0.7%.