998 resultados para deep inelastic reaction


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Electrically active defects in the phosphor-doped single-crystal silicon, induced by helium-ion irradiation under thermal annealing, have been investigated. Isothermal charge-sensitive deep-level transient spectroscopy was employed to study the activation energy and capture cross-section of helium-induced defects in silicon samples. It was shown that the activation energy levels produced by helium-ion irradiation first increased with increasing annealing temperature, with the maximum value of the activation energy occurring at 873K, and reduced with further increase of the annealing temperature. The energy levels of defects in the samples annealed at 873 and 1073K are found to be located near the mid-forbidden energy gap level so that they can act as thermally stable carrier recombination centres.

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The total cross-section for the dd → 4HeK+K− reaction has been measured at a beam momentum of 3.7GeV/c, corresponding to an excess energy of 39MeV, which is the maximum possible atthe Cooler Synchrotron COSY-Jülich. A deuterium cluster-jet target and the ANKE forward magnetic spectrometer, placed inside the storage ring, have been employed in this investigation. We find a total cross-section of σtot < 14 pb, which brings into question the viability of investigating the dd → 4He a0(980)reaction as a means of studying isospin violation.

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Within the transport model IBUU04, we investigate the double neutron/proton ratio of free nucleons taken from two reaction systems using two Sn isotopes at the beam energy of 50MeV/nucleon and with the impact parameters 2 fm, 4 fm and 8 fm, respectively. It is found that the double neutron/proton ratio from peripheral collisions is more sensitive to the density dependence of the symmetry energy than those from mid-central and central collisions.