890 resultados para Fisher exact test


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Abstract—DC testing of parametric faults in non-linear analog circuits based on a new transformation, entitled, V-Transform acting on polynomial coefficient expansion of the circuit function is presented. V-Transform serves the dual purpose of monotonizing polynomial coefficients of circuit function expansion and increasing the sensitivity of these coefficients to circuit parameters. The sensitivity of V-Transform Coefficients (VTC) to circuit parameters is up to 3x-5x more than sensitivity of polynomial coefficients. As a case study, we consider a benchmark elliptic filter to validate our method. The technique is shown to uncover hitherto untestable parametric faults whose sizes are smaller than 10 % of the nominal values. I.

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Technology scaling has caused Negative Bias Temperature Instability (NBTI) to emerge as a major circuit reliability concern. Simultaneously leakage power is becoming a greater fraction of the total power dissipated by logic circuits. As both NBTI and leakage power are highly dependent on vectors applied at the circuit’s inputs, they can be minimized by applying carefully chosen input vectors during periods when the circuit is in standby or idle mode. Unfortunately input vectors that minimize leakage power are not the ones that minimize NBTI degradation, so there is a need for a methodology to generate input vectors that minimize both of these variables.This paper proposes such a systematic methodology for the generation of input vectors which minimize leakage power under the constraint that NBTI degradation does not exceed a specified limit. These input vectors can be applied at the primary inputs of a circuit when it is in standby/idle mode and are such that the gates dissipate only a small amount of leakage power and also allow a large majority of the transistors on critical paths to be in the “recovery” phase of NBTI degradation. The advantage of this methodology is that allowing circuit designers to constrain NBTI degradation to below a specified limit enables tighter guardbanding, increasing performance. Our methodology guarantees that the generated input vector dissipates the least leakage power among all the input vectors that satisfy the degradation constraint. We formulate the problem as a zero-one integer linear program and show that this formulation produces input vectors whose leakage power is within 1% of a minimum leakage vector selected by a search algorithm and simultaneously reduces NBTI by about 5.75% of maximum circuit delay as compared to the worst case NBTI degradation. Our paper also proposes two new algorithms for the identification of circuit paths that are affected the most by NBTI degradation. The number of such paths identified by our algorithms are an order of magnitude fewer than previously proposed heuristics.

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Scan circuit is widely practiced DFT technology. The scan testing procedure consist of state initialization, test application, response capture and observation process. During the state initialization process the scan vectors are shifted into the scan cells and simultaneously the responses captured in last cycle are shifted out. During this shift operation the transitions that arise in the scan cells are propagated to the combinational circuit, which inturn create many more toggling activities in the combinational block and hence increases the dynamic power consumption. The dynamic power consumed during scan shift operation is much more higher than that of normal mode operation.

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A geometric and non parametric procedure for testing if two finite set of points are linearly separable is proposed. The Linear Separability Test is equivalent to a test that determines if a strictly positive point h > 0 exists in the range of a matrix A (related to the points in the two finite sets). The algorithm proposed in the paper iteratively checks if a strictly positive point exists in a subspace by projecting a strictly positive vector with equal co-ordinates (p), on the subspace. At the end of each iteration, the subspace is reduced to a lower dimensional subspace. The test is completed within r ≤ min(n, d + 1) steps, for both linearly separable and non separable problems (r is the rank of A, n is the number of points and d is the dimension of the space containing the points). The worst case time complexity of the algorithm is O(nr3) and space complexity of the algorithm is O(nd). A small review of some of the prominent algorithms and their time complexities is included. The worst case computational complexity of our algorithm is lower than the worst case computational complexity of Simplex, Perceptron, Support Vector Machine and Convex Hull Algorithms, if d

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A built-in-self-test (BIST) subsystem embedded in a 65-nm mobile broadcast video receiver is described. The subsystem is designed to perform analog and RF measurements at multiple internal nodes of the receiver. It uses a distributed network of CMOS sensors and a low bandwidth, 12-bit A/D converter to perform the measurements with a serial bus interface enabling a digital transfer of measured data to automatic test equipment (ATE). A perturbation/correlation based BIST method is described, which makes pass/fail determination on parts, resulting in significant test time and cost reduction.

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In this paper, we present an algebraic method to study and design spatial parallel manipulators that demonstrate isotropy in the force and moment distributions.We use the force and moment transformation matrices separately,and derive conditions for their isotropy individually as well as in combination. The isotropy conditions are derived in closed-form in terms of the invariants of the quadratic forms associated with these matrices. The formulation has been applied to a class of Stewart platform manipulators. We obtain multi-parameter families of isotropic manipulator analytically. In addition to computing the isotropic configurations of an existing manipulator,we demonstrate a procedure for designing the manipulator for isotropy at a given configuration.

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Regenerating codes are a class of distributed storage codes that allow for efficient repair of failed nodes, as compared to traditional erasure codes. An [n, k, d] regenerating code permits the data to be recovered by connecting to any k of the n nodes in the network, while requiring that a failed node be repaired by connecting to any d nodes. The amount of data downloaded for repair is typically much smaller than the size of the source data. Previous constructions of exact-regenerating codes have been confined to the case n = d + 1. In this paper, we present optimal, explicit constructions of (a) Minimum Bandwidth Regenerating (MBR) codes for all values of [n, k, d] and (b) Minimum Storage Regenerating (MSR) codes for all [n, k, d >= 2k - 2], using a new product-matrix framework. The product-matrix framework is also shown to significantly simplify system operation. To the best of our knowledge, these are the first constructions of exact-regenerating codes that allow the number n of nodes in the network, to be chosen independent of the other parameters. The paper also contains a simpler description, in the product-matrix framework, of a previously constructed MSR code with [n = d + 1, k, d >= 2k - 1].

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In this article, we study the exact controllability of an abstract model described by the controlled generalized Hammerstein type integral equation $$ x(t) = int_0^t h(t,s)u(s)ds+ int_0^t k(t,s,x)f(s,x(s))ds, quad 0 leq t leq T less than infty, $$ where, the state $x(t)$ lies in a Hilbert space $H$ and control $u(t)$ lies another Hilbert space $V$ for each time $t in I=[0,T]$, $T$ greater than 0. We establish the controllability result under suitable assumptions on $h, k$ and $f$ using the monotone operator theory.

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The success of an ABV IP depends highly on the associated debugging environment. An efficient debugging environment helps the user to find out the exact location of the failure. Moreover, it provides information to the user in a refined detail of abstraction and permit adequate interaction. It has also been realized that adequate visualization support helps in tracking the behavioral aspects of the Design Under Test (DUT). Currently, the debugging tools provide information in the signal level and do not provide any information about the high-level behavior of the DUT. We present a debugging framework that takes the design specification, assertions and the user intent in a simple format and provides detailed information by processing the design trace on-line, or off-line. We also present a visualization framework to ease the debugging procedure. We have experimented with industrial standard on-chip bus protocols that ensure that this utility can be incorporated successfully in the present functional verification flow.