970 resultados para analog-digital conversion (ADC)
Resumo:
An analog minimum-variance unbiased estimator(MVUE) over an asymmetric wireless sensor network is studied.Minimisation of variance is cast into a constrained non-convex optimisation problem. An explicit algorithm that solves the problem is provided. The solution is obtained by decomposing the original problem into a finite number of convex optimisation problems with explicit solutions. These solutions are then juxtaposed together by exploiting further structure in the objective function.
Resumo:
This correspondence presents an algorithm for microprogram control memory width minimization with the bit steering technique. The necessary and sufficient conditions to detect the steerability of two mutually exclusive sets of microcommands are established. The algorithm encodes the microcommands of the sets with a bit steering common part and also extends the theory to multiple (more than two) sets of microcommands.
Resumo:
Digital Image Correlation and Tracking (DIC/DDIT) is an optical method that employs tracking & image registration techniques for accurate 2D and 3D measurements of changes in images. This is often used to measure deformation (engineering), displacement, and strain, but it is widely applied in many areas of science and engineering. One very common application is for measuring the motion of an optical mouse.
Resumo:
Abstract—A method of testing for parametric faults of analog circuits based on a polynomial representaion of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the applied input voltage at relevant frequencies apart from DC. Classification of CUT is based on a comparison of the estimated polynomial coefficients with those of the fault free circuit. The method needs very little augmentation of circuit to make it testable as only output parameters are used for classification. This procedure is shown to uncover several parametric faults causing smaller than 5 % deviations the nominal values. Fault diagnosis based upon sensitivity of polynomial coefficients at relevant frequencies is also proposed.
Resumo:
Transfer function coefficients (TFC) are widely used to test linear analog circuits for parametric and catastrophic faults. This paper presents closed form expressions for an upper bound on the defect level (DL) and a lower bound on fault coverage (FC) achievable in TFC based test method. The computed bounds have been tested and validated on several benchmark circuits. Further, application of these bounds to scalable RC ladder networks reveal a number of interesting characteristics. The approach adopted here is general and can be extended to find bounds of DL and FC of other parametric test methods for linear and non-linear circuits.
Resumo:
Abstract—DC testing of parametric faults in non-linear analog circuits based on a new transformation, entitled, V-Transform acting on polynomial coefficient expansion of the circuit function is presented. V-Transform serves the dual purpose of monotonizing polynomial coefficients of circuit function expansion and increasing the sensitivity of these coefficients to circuit parameters. The sensitivity of V-Transform Coefficients (VTC) to circuit parameters is up to 3x-5x more than sensitivity of polynomial coefficients. As a case study, we consider a benchmark elliptic filter to validate our method. The technique is shown to uncover hitherto untestable parametric faults whose sizes are smaller than 10 % of the nominal values. I.
Resumo:
The resolution of the digital signal path has a crucial impact on the design, performance and the power dissipation of the radio receiver data path, downstream from the ADC. The ADC quantization noise has been traditionally included with the Front End receiver noise in calculating the SNR as well as BER for the receiver. Using the IEEE 802.15.4 as an example, we show that this approach leads to an over-design for the ADC and the digital signal path, resulting in larger power. More accurate specifications for the front-end design can be obtained by making SNRreg a function of signal resolutions. We show that lower resolution signals provide adequate performance and quantization noise alone does not produce any bit-error. We find that a tight bandpass filter preceding the ADC can relax the resolution requirement and a 1-bit ADC degrades SNR by only 1.35 dB compared to 8-bit ADC. Signal resolution has a larger impact on the synchronization and a 1-bit ADC costs about 5 dB in SNR to maintain the same level of performance as a 8-bit ADC.
Resumo:
This letter proposes a simple tuning algorithm for digital deadbeat control based on error correlation. By injecting a square-wave reference input and calculating the correlation of the control error, a gain correction for deadbeat control is obtained. The proposed solution is simple, it requires a short tuning time, and it is suitable for different DC-DC converter topologies. Simulation and experimental results on synchronous buck converters confirm the properties of the proposed tuning algorithm.
Resumo:
The paper presents an adaptive Fourier filtering technique and a relaying scheme based on a combination of a digital band-pass filter along with a three-sample algorithm, for applications in high-speed numerical distance protection. To enhance the performance of above-mentioned technique, a high-speed fault detector has been used. MATLAB based simulation studies show that the adaptive Fourier filtering technique provides fast tripping for near faults and security for farther faults. The digital relaying scheme based on a combination of digital band-pass filter along with three-sample data window algorithm also provides accurate and high-speed detection of faults. The paper also proposes a high performance 16-bit fixed point DSP (Texas Instruments TMS320LF2407A) processor based hardware scheme suitable for implementation of the above techniques. To evaluate the performance of the proposed relaying scheme under steady state and transient conditions, PC based menu driven relay test procedures are developed using National Instruments LabVIEW software. The test signals are generated in real time using LabVIEW compatible analog output modules. The results obtained from the simulation studies as well as hardware implementations are also presented.
Resumo:
A methodology is presented for the synthesis of analog circuits using piecewise linear (PWL) approximations. The function to be synthesized is divided into PWL segments such that each segment can be realized using elementary MOS current-mode programmable-gain circuits. A number of these elementary current-mode circuits when connected in parallel, it is possible to realize piecewise linear approximation of any arbitrary analog function with in the allowed approximation error bounds. Simulation results show a close agreement between the desired function and the synthesized output. The number of PWL segments used for approximation and hence the circuit area is determined by the required accuracy and the smoothness of the resulting function.