964 resultados para PHOTON STATISTICS


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Parametric VaR (Value-at-Risk) is widely used due to its simplicity and easy calculation. However, the normality assumption, often used in the estimation of the parametric VaR, does not provide satisfactory estimates for risk exposure. Therefore, this study suggests a method for computing the parametric VaR based on goodness-of-fit tests using the empirical distribution function (EDF) for extreme returns, and compares the feasibility of this method for the banking sector in an emerging market and in a developed one. The paper also discusses possible theoretical contributions in related fields like enterprise risk management (ERM). © 2013 Elsevier Ltd.

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Presenta el resumen de los debates de la reunión que tuvo como principales propósitos evaluar los avances logrados en actividades preparatorias de la Ronda de Censos del 90, absorción de tecnologías computacionales para el desarrollo estadístico de la región, cooperación técnica, capacitación y situación de las estadísticas sociales.

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Includes bibliography

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Includes bibliography