982 resultados para 1530
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Current nanometer technologies suffer within-die parameter uncertainties, varying workload conditions, aging, and temperature effects that cause a serious reduction on yield and performance. In this scenario, monitoring, calibration, and dynamic adaptation become essential, demanding systems with a collection of multi purpose monitors and exposing the need for light-weight monitoring networks. This paper presents a new monitoring network paradigm able to perform an early prioritization of the information. This is achieved by the introduction of a new hierarchy level, the threshing level. Targeting it, we propose a time-domain signaling scheme over a single-wire that minimizes the network switching activity as well as the routing requirements. To validate our approach, we make a thorough analysis of the architectural trade-offs and expose two complete monitoring systems that suppose an area improvement of 40% and a power reduction of three orders of magnitude compared to previous works.
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Pie de imp. tomado del colofón
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Pie de imp. tomado del colofón
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Pie de imp. tomado del colofón
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Marca tip. de Berthold Rembolt en port. (Renouard, 961)
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Marca tip. de Berthold Rembolt en port. (Renouard, 961)
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Lugar y fecha de imp. tomados de ISTC e impresor del colofón
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Capitulares grab. xil.
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Pie de imp. tomado del colofón, en I6r
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Lugar, imp. y fecha tomados de R5
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Lugar y fecha de imp. tomados del colofón e impresor de IBE
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Hojas imp. por ambas caras
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Hojas imp. por ambas caras
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Sign.: a-z8, 2a-2f8, 2g-2h6
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Capitulares grab. xil.