996 resultados para ELECTRON-AFFINITY

Plasma oxidation of silicon using an electron cyclotron wave resonance (ecwr) plasma source

Relevância:

20.00% 20.00%

Publicador:

Veja mais

XpertEze: developing embedded intelligence for the scanning electron microscope

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Density, sp3 fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Density, sp3 fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy

Relevância:

20.00% 20.00%

Publicador:

Veja mais

The role of dc current limitations in Fowler–Nordheim electron emission from carbon films

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Electron emission from amorphous and nanocluster carbon films grown by the cathodic arc process

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Determination of bonding in amorphous carbons by electron energy loss spectroscopy, Raman scattering and X-ray reflectivity

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Density, sp3 content and internal layering of DLC films by X-ray reflectivity and electron energy loss spectroscopy

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Deposition of carbon nitride films using an electron cyclotron wave resonance plasma source

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Low field electron emission from nanoclustered carbon grown by cathodic arc

Relevância:

20.00% 20.00%

Publicador:

Veja mais

VSEM: An interactive simulation and virtual reality model of the scanning electron microscope

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Electron field emission from cluster-assembled carbon thin films

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Electron field emission from cluster-assembled carbon thin films

Relevância:

20.00% 20.00%

Publicador:

Veja mais

High rate deposition of ta-C:H using an electron cyclotron wave resonance plasma source

Relevância:

20.00% 20.00%

Publicador:

Veja mais

World Wide Web controlled scanning electron microscope

Relevância:

20.00% 20.00%

Publicador:

Veja mais