984 resultados para conservação ex situ
Resumo:
Biogeochemical measurements in sediment cores collected with the submersible JAGO (pusch cores) and a TV-MUC in the Black Sea during MSM15/1, Northwest Crimea (HYPOX Project), at water depths between 152-156 m. A series of microbial mats were sampled on the hypoxic region of the Crimean Shelf. Concentrations of organic carbon (Corg) and nitrogen (N) were measured on finely powdered, freeze-dried subsamples of sediment using a using a Fisons NA-1500 elemental analyzer. For organic carbon determination samples were pre-treated with 12.5% HCl to remove carbonates. Chlorophyll a (chl a), phaeopigments (PHAEO) and chloroplastic pigment equivalents (CPE) was measured according to Schubert et al., (2005; doi:10.1029/2004GC000837) and total hydrolyzable amino acids (THAA) and single amino acid: ASP, GLU, SER, HIS, GLY, THR, ARG, ALA, TYR, MET, VAL, PHE, ILE, LEU, LYS following Dauwe et al., 1998. High-resolution ex situ sulfide and pH microprofiles, were assessed only for station MSM15/1_492_PUC1. "in mat 1, 2 and 3" refers to 3 different profiles in 3 different spots of the microbial mat, whereas "outside mat", a profile outside the microbial mat.
Resumo:
Sediment samples were collected from the rim of a large vesicomyid clam colony in the Japan Deep Sea Trench. Immediately after sample recovery onboard, the sediment core was sub-sampled for ex situ rate measurements. Sulfate reduction were measured ex situ by the whole core injection method with three replicates. We incubated the samples at in situ temperature (1.5°C) for 48 hours with carrier-free 35SO4 (dissolved in water, 50 kBq). Sediment was fixed 20 ml ZnAc solution (20%, w/v) for AOM or SR. Turnover rates were measured as previously described (Kallmeyer et al., 2004).
Resumo:
Sediment samples were collected from the rim of a large vesicomyid clam colony in the Japan Deep Sea Trench. Immediately after sample recovery onboard, the sediment core was sub-sampled for ex situ rate measurements. Sulfate reduction were measured ex situ by the whole core injection method with three replicates. We incubated the samples at in situ temperature (1.5°C) for 48 hours with carrier-free 35SO4 (dissolved in water, 50 kBq). Sediment was fixed 20 ml ZnAc solution (20%, w/v) for AOM or SR. Turnover rates were measured as previously described (Kallmeyer et al., 2004).
Resumo:
In this work we present the results and analysis of a 10 MeV proton irradiation experiment performed on III-V semiconductor materials and solar cells. A set of representative devices including lattice-matched InGaP/GaInAs/Ge triple junction solar cells and single junction GaAs and InGaP component solar cells and a Ge diode were irradiated for different doses. The devices were studied in-situ before and after each exposure at dark and 1 sun AM0 illumination conditions, using a solar simulator connected to the irradiation chamber through a borosilicate glass window. Ex-situ characterization techniques included dark and 1 sun AM0 illumination I-V measurements. Furthermore, numerical simulation of the devices using D-AMPS-1D code together with calculations based on the TRIM software were performed in order to gain physical insight on the experimental results. The experiment also included the proton irradiation of an unprocessed Ge solar cell structure as well as the irradiation of a bare Ge(100) substrate. Ex-situ material characterization, after radioactive deactivation of the samples, includes Raman spectroscopy and spectral reflectivity.