993 resultados para Écrit de soi


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以宁夏固原云雾山自然保护区典型草原为研究对象,采用空间序列代替时间序列的方法,以坡耕地为对照,对封育演替草地百里香(Thymus mongolicus Ronn.)、铁杆蒿(Artemisia sacrorum Ledeb.)、大针茅(Stipa grandis P.Smirn.)和本氏针茅(Stipa bungeana Trin.)群落0~10 cm表层土壤水稳性团聚体分布、孔隙度及土壤结构评价指标进行了研究和分析。结果表明:草地实施封育措施能明显改善土壤结构特征,随着草地植被自然演替,土壤的结构稳定性和孔隙状况逐步得到提高;在演替过程中,封育草地土壤的>0.25 mm水稳性团聚体含量(WSAC)、平均重量直径(MWD)、几何平均直径(GMD)和孔隙分形维数(Dp)逐渐增加,团聚体分形维数(Da)逐渐减少,说明植被演替能促进形成良好的土壤结构;同时,土壤结构影响因素随着草地植被演替过程表现出有机碳含量显著增加,容重显著降低,毛管孔隙度逐渐增大,非毛管孔隙度逐渐降低。本研究还比较了多项土壤结构评价指标,表明与MWD和GMD相比,指标WSAC(>0.25 mm)、Da及Dp能更好地反映出各封育草地群落之间土壤结...

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光互连是突破传统微电子IC性能瓶颈的重要技术手段,对推进"后摩尔时代"微电子技术的发展和高性能计算技术的实现具有关键性意义.本文在归纳总结不同层次光互连结构特点的基础上,对片上光互连(on-chip or intra-chip optical interconnects)所涉及的若干种无源光子集成器件的设计制备及性能特点进行了分析介绍,这些器件包括SOI亚波长光子线波导、SOI光子晶体波导、MMI分束/合束器、微环/微盘谐振腔滤波器、光子晶体微腔耦合滤波器、光子晶体反射镜等,是硅基片上光互连的基本构成单元.本文对这些关键性光子集成器件的国内最新研究进展进行了报道.

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基于SOI(silicon on insulator)材料的亚微米尺度电光调制器成为了研究Si光电子学的重点.评述了亚微米尺度下SOI脊型光波导实现单模条件、偏振无关、低耦合损耗的技术要求,分析并比较了几种基于不同光学结构和电学结构的电光调制器的原理和特性,讨论了达到高速电光调制的方式.

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硅基波导型光电探测器作为一类重要的光电探测器,由于其能与标准的CMOS工艺兼容以及制备工艺简单等性能,因而在光电子单片集成方面具备广阔的市场应用前景.文章着重阐述了通过离子注入引入深能级、Ge/Si自组装岛、SOI波导共振腔增强和AlGaInAs-Si混合集成等四种方式来制备硅基光电探测器的研究现状和研究进展,并对四类器件的结构,制作工艺和光电性能指标进行了详细地介绍.

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研究了慢光模式在SOI(silicon-on-insulator)材料光子晶体线缺陷弯折波导中的传输特性.通过优化波导弯折处的结构参数,慢光模式在光子晶体60°与120°弯折波导中的透射率提高10倍以上,归一化透射率分别达到80%和60%以上.为了进一步减慢光速,设计了新颖的高Q值耦合腔弯折波导结构,在归一化透射率达到75%的基础上,光波群速度低至c/170(c为真空光速).研究结果对于增强光子晶体的慢光效应,提高光子晶体慢光器件的微型化和集成化都有一定的积极意义.

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光开关是光网络中实现光交换的核心器件。硅基波导光开关作为一类重要的开关器件,具有体积小、开关速度快、兼容性好等优点。近年来随着硅基波导制作技术的成熟,硅基波导光开关及开关阵列的研究日益受到人们的重视。文章介绍了SOI(silicon—on—insulater)光波导、聚合物光波导和SiO_2光波导等三类常见的硅基波导在光开关及开关阵列方面的一些研究进展。

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近年来硅基光电子材料和器件受到高度的重视.利用外延生长和键合技术成功研制出硅基应变赝衬底、GexSi1-x/Si量子阱、高密度锗量子点、硅基InGaAsP/Si异质结,这些进展为硅基光电子器件提供了坚实的材料基础.同CMOS工艺相结合,实现了硅量子点1.17 μm的受激发射,研制出硅基Raman激光器、1.55 μm混合型激光器、高灵敏度的Si/Ge探测器、谐振腔增强型的SiGe光电二极管、调制频率30 GHz的SOI CMOS光学调制器和16×16的SOI光开关阵列等.硅光电子学将在光通信、光计算等领域获得重要应用.本文综述了国内外硅基光电子材料和器件的进展、我们的研究结果和硅基光电子学的发展趋势.

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介绍在部分耗尽绝缘体上硅(PD SOI)衬底上形成的抗辐射128kb静态随机存储器.在设计过程中,利用SOI器件所具有的特性,对电路进行精心的设计和层次化版图绘制,通过对关键路径和版图后全芯片的仿真,使得芯片一次流片成功.基于部分耗尽SOI材料本身所具有的抗辐射特性,通过采用存储单元完全体接触技术和H型栅晶体管技术,不仅降低了芯片的功耗,而且提高了芯片的总体抗辐射水平.经过测试,芯片的动态工作电流典型值为20mA@10MHz,抗总剂量率水平达到500krad(Si),瞬态剂量率水平超过2.45×10~(11) rad(Si)/s.这些设计实践必将进一步推动PD SOI CMOS工艺的研发,并为更大规模抗辐射电路的加固设计提供更多经验.

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We propose and analyze a novel Si-based electro-optic modulator with an improved metal-oxide-semiconductor (MOS) capacitor configuration integrated into silicon-on-insulator (SOI).Three gate-oxide layers embedded in the silicon waveguide constitute a triple MOS capacitor structure,which boosts the modulation efficiency compared with a single MOS capacitor.The simulation results demonstrate that the VπLπ product is 2.4V·cm.The rise time and fall time of the proposed device are calculated to be 80 and 40ps from the transient response curve,respectively,indicating a bandwidth of 8GHz.The phase shift efficiency and bandwidth can be enhanced by rib width scaling.

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以柱坐标下的半矢量波动方程为基础,采用基于完美匹配层(PML)边界条件的有限差分方法,对弯曲波导进行模式求解,进而得到波导弯曲引起的辐射损耗.基于计算得到的直弯波导的模场分布,采用二维重叠积分法计算了两者连接时的过渡损耗.计算结果与已有实验结果符合较好.采用该方法,研究了SOI脊型波导的弯曲损耗与波导结构参数之间的关系,并对直弯波导的连接进行了优化.

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One group of SiC films are grown on silicon-on-insulator (SOI) substrates with a series of silicon-overlayer thickness. Raman scattering spectroscopy measurement clearly indicates that a systematic trend of residual stress reduction as the silicon over-layer thickness decreases for the SOI substrates. Strain relaxation in the SiC epilayer is explained by force balance approach and near coincidence lattice model.

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在SIMOX SOI超薄硅衬底上外延生长了高质量SiGe合金薄膜来制备SGOI(SiGe on insulator)样品,并研究了其在1050℃氧化气氛中的高温退火行为.用Raman,DCXRD,RBS和光学显微镜等分析手段对SGOI样品在退火前后的性能进行了表征.分析结果表明

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In order to improve the total-dose radiation hardness of the buried oxides(BOX) in the structure of separa tion-by-implanted-oxygen(SIMOX) silicon-on-insulator(SOI), nitrogen ions are implanted into the buried oxides with two different doses,2 × 1015 and 3 × 1015 cm-2 , respectively. The experimental results show that the radiation hardness of the buried oxides is very sensitive to the doses of nitrogen implantation for a lower dose of irradiation with a Co-60 source. Despite the small difference between the doses of nitrogen implantation, the nitrogen-implanted 2 × 1015 cm-2 BOX has a much higher hardness than the control sample (i. e. the buried oxide without receiving nitrogen implantation) for a total-dose irradiation of 5 × 104rad(Si), whereas the nitrogen-implanted 3 × 1015 cm-2 BOX has a lower hardness than the control sample. However,this sensitivity of radiation hardness to the doses of nitrogen implantation reduces with the increasing total-dose of irradiation (from 5 × 104 to 5 × 105 rad (Si)). The radiation hardness of BOX is characterized by MOS high-frequency (HF) capacitance-voltage (C-V) technique after the top silicon layers are removed. In addition, the abnormal HF C-V curve of the metal-silicon-BOX-silicon(MSOS) structure is observed and explained.

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报导了可用于光网络系统终端OADM和OXC的Si基长波长量子阱窄带响应光电接收器,MOEMS和F-P TO宽频域光学滤波器,M—Z型TO光开关和MMI多路分束器以及可变光强衰减器.用应变层SiGe/Si MQW研制的RCE光电接收器响应谱半宽FWHM<6mm,外量子效率η>4.2%;采用表面微机械加工的桥式光学滤波器,当外加电压0→50V,连续可调谐范围达90nm;采用全平面工艺研制的F-P腔TO滤波器,当外加电流0→57mA时,连续可调谐范围达23nm,FWHM<0.5nm.在SOI Si基片上研制的M—ZTO波导光开关,开关时间<30μs,功耗~100mW.开关消光比-13dB和-10dB,1×4MMI多路分束器输出光场的不均衡性<0.36dB,总插入损耗6.9dB.用背向对接的MMI构成的M-Z干涉仪实现了光强的可变调最大衰减量26dB,响应时间100μs,插入损耗4.8~7dB.

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和直波导的不同在于,三维楔脊形波导中的光场都是不稳定的.分别对波导-光纤耦合、光纤-波导耦合两种情况,将三维楔脊形波导等效为多段短的直波导,利用束传播法同时对三维楔脊形波导内不稳定的入射、反射场,及它们在传播方向上的偏导进行处理,再用自由空间辐射模法计算透射率和反射率.以SOI楔脊形波导和光纤的耦合为例,验证了该方法的可行性.