QUANTITATIVE-ANALYSIS OF INXGA1-XAS BY AUGER-ELECTRON SPECTROSCOPY

Quantitative Auger electron spectroscopy analysis for the ternary system InGa1-xAs grown by molecular-beam epitaxy has been studied. The relative sensitivity factors are determined by with an internal reference element. The matrix correction factor for In relative to Ga was shown to be 1.08. No preferential sputtering of As for the ternary compounds was found, and the sputter correction factor, K(s)InGa is 0.75. The results are compared with that measured by the x-ray double-crystal diffraction analysis, electron probe microanalysis, and Auger analysis without matrix and sputter corrections.

Tree-ringbased drought reconstruction (a.d. 1855-2001) for the Qilian mountains；northwestern China

IEECAS SKLLQG

Climatic changes in Eurasia and Africa at the last glacial maximum and mid-Holocene: reconstruction from pollen data using inverse vegetation modelling

IEECAS SKLLQG

Climatic reconstruction at the miocene shanwang basin；China；using leaf margin analysis；clamp；coexistence approach；and overlapping distribution analysis

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Sea surface temperature reconstruction for the middle Okinawa Trough during the last glacial-interglacial cycle using C-37 unsaturated alkenones

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Reconstruction of late glacial and Holocene climate evolution in southern China from geolipids and pollen in the Dingnan peat sequence

IEECAS SKLLQG