Optimization Of Off-Null Ellipsometry For Air/Solid Interfaces

The optimization of off-null ellipsometry is described with emphasis on the improvement of sample thickness sensitivity. Optimal conditions are dependent on azimuth angle settings of the polarizer, compensator, and analyzer in a polarizer-compensator-sample-analyzer ellipsometer arrangement. Numerical simulation utilized offers an approach to present the dependence of the sensitivity on the azimuth angle settings, from which optimal settings corresponding to the best sensitivity are derived. For a series of samples of SiO2 layer (thickness in the range of 1.8-6.5 nm) on silicon substrate, the theory analysis proves that sensitivity at the optimal settings is increased 20 times compared to that at null settings used in most works, and the relationship between intensity and thickness is simplified as a linear type instead of the original nonlinear type, with the relative error reduced to similar to 1/100 at the optimal settings. Furthermore the discussion has been extended toward other factors affecting the sensitivity of the practical system, such as the linear dynamic range of the detector, the signal-to-noise ratio and the intensity from the light source, etc. Experimental results from the investigation Of SiO2 layer on silicon substrate are chosen to verify the optimization. (c) 2007 Optical Society of America.

Quasi-Dammann Grating With Proportional Intensity Array Spots

A quasi-Dammann grating is proposed to generate array spots with proportional-intensity orders in the far field. To describe the performance of the grating, the uniformities of the array spots are redefined. A two-dimensional even-sampling encode scheme is adopted to design the quasi-Dammann grating. Numerical solutions of the binary-phase quasi-Dammann grating with proportional-intensity orders are given. The experimental results with a third-order quasi-Dammann grating, which has an intensity proportion of 3:2:1 from zero order to second order, are presented. (C) 2008 Optical Society of America

Statistical Interpolation Method of Turbulent Phase Screen

A relative displacement between the grid points of optical fields and those of phase screens may occur in the simulation of light propagation through the turbulent atmosphere. A statistical interpolator is proposed to solve this problem in this paper. It is evaluated by the phase structure function and numerical experiments of light propagation through atmospheric turbulence with/without adaptive optics (AO) and it is also compared with the well-known linear interpolator under the same condition. Results of the phase structure function show that the statistical interpolator is more accurate in comparison with the linear one, especially in the high frequency region. More importantly, the long-exposure results of light propagation through the turbulent atmosphere with/without AO also show that the statistical interpolator is more accurate and reliable than the linear one. (C) 2009 Optical Society of America.

Study of the surface structure of butterfly wings using the scanning electron microscopic moire method

Scanning electron microscopic (SEM) moire method was used to study the surface structure of three kinds of butterfly wings: Papilio maackii Menetries, Euploea midamus (Linnaeus), and Stichophthalma how-qua (Westwood). Gratings composed of curves with different orientations were found on scales. The planar characteristics of gratings and some other planar features of the surface structure of these wings were revealed, respectively, in terms of virtual strain. Experimental results demonstrate that SEM moire method is a simple, nonlocal, economical, effective technique for determining which grating exists on one whole scale, measuring the dimension and the whole planar structural character of the grating on each scale, as well as characterizing the relationship between gratings on different scales of each butterfly wing. Thus, the SEM moire method is a useful tool to assist with characterizing the structure of butterfly wings and explaining their excellent properties. (c) 2007 Optical Society of America.