Study of the brittle fracture of monocrystalline silicon wafers

There is a growing trend towards using thinner wafers in order to reduce the costs of solar energy. But the current tools employed during the solar cells production are not prepared to work with thinner wafers, decreasing the industrial yield due to the high number of wafers broken. To develop new tools, or modify existing ones, the mechanical properties have to be determined. This paper tackles an experimental study of the mechanical properties of wafers. First, the material characteristics are detailed and the process to obtain wafers is presented. Then, the complete test setup and the mechanical strength results interpreted by a described numerical model are shown.

Mechanical characterization of multicrystalline silicon wafers

The possibility of using more economical silicon feedstock, i.e. as support for epitaxial solar cells, is of interest when the cost reduction and the properties are attractive. We have investigated the mechanical behavior of two blocks of upgraded metallurgical silicon, which is known to present high content of impurities even after being purified by the directional solidification process. The impurities are mainly metals like Al and silicon compounds. Thus, it is important to characterize their effect in order to improve cell performance and to ensure the survival of the wafers throughout the solar value chain. Microstructure and mechanical properties were studied by means of ring on ring and three point bending tests. Additionally, Young’s modulus, hardness and fracture toughness were measured. These results showed that it is possible to obtain marked improvements in toughness when impurities act as microscopic internal crack arrestors. However, the same impurities can be initiators of damage due to residual thermal stresses introduced during the crystallization process.

Progress on the development of a technology for silicon purification

The polysilicon market is experiencing tremendous changes due to the strong demand from Photovoltaics (PV), which has by far surpassed the demand from Microelectronics. The need of solar silicon has induced a large increase in capacity, which has now given a scenario of oversupply, reducing the polysilicon price to levels that put a strong pressure on the cost structure of the producers. The paper reports on the R&D efforts carried out in the field of solar silicon purification via the chlorosilane route by a private-public consortium that is building a pilot plant of 50-100 tonnes/year, that will synthesize trichlorosilane, purify it and deposit ultrapure silicon in an industrial-size Siemens type reactor. It has also capabilities for ingot growth and material characterization. A couple of examples of the progress so far are given, the first one related to the recycling scheme of chlorinated compounds, and the second to the minimization of radiation losses in the CVD deposition process, which account for a relevant part of the total energy consumption. In summary, the paper gives details on the technology being developed in our pilot plant, which offers a unique platform for field-testing of innovative approaches that can lead to a cost reduction of solar silicon produced via the chlorosilane route.

Fracture strength of drilled wafers: study of the stress concentration factor and determination of the weibull distribution of the fracture stress

In the photovoltaic field, the back contact solar cells technology has appeared as an alternative to the traditional silicon modules. This new type of cells places both positive and negative contacts on the back side of the cells maximizing the exposed surface to the light and making easier the interconnection of the cells in the module. The Emitter Wrap-Through solar cell structure presents thousands of tiny holes to wrap the emitter from the front surface to the rear surface. These holes are made in a first step over the silicon wafers by means of a laser drilling process. This step is quite harmful from a mechanical point of view since holes act as stress concentrators leading to a reduction in the strength of these wafers. This paper presents the results of the strength characterization of drilled wafers. The study is carried out testing the samples with the ring on ring device. Finite Element models are developed to simulate the tests. The stress concentration factor of the drilled wafers under this load conditions is determined from the FE analysis. Moreover, the material strength is characterized fitting the fracture stress of the samples to a three-parameter Weibull cumulative distribution function. The parameters obtained are compared with the ones obtained in the analysis of a set of samples without holes to validate the method employed for the study of the strength of silicon drilled wafers.

New Intermediate band sulphide nanoparticles acting in the full visible light range spectra as an active photocatalyst

Nowadays one of the challenges of materials science is to find new technologies that will be able to make the most of renewable energies. An example of new proposals in this field are the intermediate-band (IB) materials, which promise higher efficiencies in photovoltaic applications (through the intermediate band solar cells), or in heterogeneous photocatalysis (using nanoparticles of them, for the light-induced degradation of pollutants or for the efficient photoevolution of hydrogen from water). An IB material consists in a semiconductor in which gap a new level is introduced [1], the intermediate band (IB), which should be partially filled by electrons and completely separated of the valence band (VB) and of the conduction band (CB). This scheme (figure 1) allows an electron from the VB to be promoted to the IB, and from the latter to the CB, upon absorption of photons with energy below the band gap Eg, so that energy can be absorbed in a wider range of the solar spectrum and a higher current can be obtained without sacrificing the photovoltage (or the chemical driving force) corresponding to the full bandgap Eg, thus increasing the overall efficiency. This concept, applied to photocatalysis, would allow using photons of a wider visible range while keeping the same redox capacity. It is important to note that this concept differs from the classic photocatalyst doping principle, which essentially tries just to decrease the bandgap. This new type of materials would keep the full bandgap potential but would use also lower energy photons. In our group several IB materials have been proposed, mainly for the photovoltaic application, based on extensively doping known semiconductors with transition metals [2], examining with DFT calculations their electronic structures. Here we refer to In2S3 and SnS2, which contain octahedral cations; when doped with Ti or V an IB is formed according to quantum calculations (see e.g. figure 2). We have used a solvotermal synthesis method to prepare in nanocrystalline form the In2S3 thiospinel and the layered compound SnS2 (which when undoped have bandgaps of 2.0 and 2.2 eV respectively) where the cation is substituted by vanadium at a ?10% level. This substitution has been studied, characterizing the materials by different physical and chemical techniques (TXRF, XRD, HR-TEM/EDS) (see e.g. figure 3) and verifying with UV spectrometry that this substitution introduces in the spectrum the sub-bandgap features predicted by the calculations (figure 4). For both sulphide type nanoparticles (doped and undoped) the photocatalytic activity was studied by following at room temperature the oxidation of formic acid in aqueous suspension, a simple reaction which is easily monitored by UV-Vis spectroscopy. The spectral response of the process is measured using a collection of band pass filters that allow only some wavelengths into the reaction system. Thanks to this method the spectral range in which the materials are active in the photodecomposition (which coincides with the band gap for the undoped samples) can be checked, proving that for the vanadium substituted samples this range is increased, making possible to cover all the visible light range. Furthermore it is checked that these new materials are more photocorrosion resistant than the toxic CdS witch is a well know compound frequently used in tests of visible light photocatalysis. These materials are thus promising not only for degradation of pollutants (or for photovoltaic cells) but also for efficient photoevolution of hydrogen from water; work in this direction is now being pursued.

Intermediate Band to Conduction Band optical absorption in ZnTe:O

ZnTe doped with high concentrations of oxygen has been proposed in previous works as intermediate band (IB) material for photovoltaic applications. The existence of extra optical transitions related to the presence of an IB has already been demonstrated in this material and it has been possible to measure the absorption coefficient of the transitions from the valence band (VB) to the IB. In this work we present the first measurement of the absorption coefficient associated to transitions from the IB to the conduction band (CB) in ZnTe:O. The samples used are 4 ?m thick ZnTe layers with or without O in a concentration ~ 1019 cm-3, which have been grown on semi-insulating GaAs substrates by molecular beam epitaxy (MBE). The IB-CB absorption coefficient peaks for photon energies ~ 0.4 eV. It is extracted from reflectance and transmittance spectra measured using Fourier Transform Infrared (FTIR) spectroscopy. Under typical FTIR measurement conditions (low light intensity, broadband spectrum) the absorption coefficient in IB-to-CB transitions reaches 700 cm-1. This is much weaker than the one observed for VB-IB absorption. This result is consistent with the fact that the IB is expected to be nearly empty of electrons under equilibrium conditions in ZnTe(:O). The absorption for VB to IB transitions is also observed in the same samples through reflectance measurements performed in the visible range using a monochromator. These measurements are compared with the quantum efficiency (QE) from solar cells fabricated under similar conditions.

Analytic free-form lens design for tracking integration in concentrating photovoltaics

In this work the concept of tracking integration in concentrating photovoltaics (CPV) is revisited and developed further. With respect to conventional CPV, tracking integration eliminates the clear separation between stationary units of optics and solar cells, and external solar trackers. This approach is capable of further increasing the concentration ratio and makes high concentrating photovoltaics (> 500x) available for single-axis tracker installations. The reduced external solar tracking effort enables possibly cheaper and more compact installations. Our proposed optical system uses two laterally moving plano-convex lenses to achieve high concentration over a wide angular range of ±24°. The lateral movement allows to combine both steering and concentration of the incident direct sun light. Given the specific symmetry conditions of the underlying optical design problem, rotational symmetric lenses are not ideal for this application. For this type of design problems, a new free-form optics design method presented in previous papers perfectly matches the symmetry. It is derived directly from Fermat's principle, leading to sets of functional differential equations allowing the successive calculation of the Taylor series coeficients of each implicit surface function up to very high orders. For optical systems designed for wide field of view and with clearly separated optical surfaces, this new analytic design method has potential application in both fields of nonimaging and imaging optics.

Sistema de medida de mapa de electroluminiscencia para células solares de concentración

En este Trabajo Fin de Master se desarrolla una aplicación basada en Labview diseñada para la adquisición automática de mapas de electroluminiscencia de células solares en general y células solares multiunión de concentración como caso particular, para diferentes condiciones de polarización. Este sistema permitirá la adquisición de mapas de electroluminescencia de cada una de las sub-células de una célula multiunión. Las variaciones espaciales en la intensidad de electroluminescencia medida podrán ser analizadas y correlacionadas con defectos de distintos tipos en la estructura semiconductora o en los contactos metálicos que forman el dispositivo de célula solar. En la parte teórica se presenta el estado del arte referente a la caracterización de células solares basada en la técnica de electroluminiscencia, así como los antecedentes del Instituto de Energía Solar (IES) referidos a este tema. Para el desarrollo de la parte práctica ha sido necesario diseñar dos drivers en Labview. El primer driver controla una fuente-medidor, que inyecta corriente a la célula solar y recoge datos de la tensión asociada. El segundo driver se utiliza para controlar y automatizar el proceso de adquisición, mediante sensor CCD, de la imagen electroluminiscente de la célula solar sometida a unas condiciones de polarización determinadas. Estos drivers se incluyen dentro de la aplicación final desarrollada, que ofrece al usuario una interfaz para la aplicación de diferentes condiciones de polarización a la célula solar y la adquisición de los mapas de electroluminescencia. La utilización de este sistema es fundamental en los estudios de degradación de células solares que se llevan a cabo actualmente en el Instituto de Energía Solar. De hecho, en este Trabajo Fin de Máster se han realizado las primeras medidas al respecto, cuyos resultados se presentan en la parte final de esta memoria. SUMMARY. This Master Final Project develops a Labview application designed to perform the automatic acquisition of solar cell electroluminescence maps in general, and concentrator multijunction solar cells as a special case, under forward biased conditions. This system allows the acquisition of electroluminescence maps of each of the sub-cells in a multijunction cell. The spatial variations in the intensity of the electroluminescence measured can be analyzed and correlated with defects in the semiconductor structure or in the metal contacts of the solar cell. In the theory section of this memory, the state of the art of the electroluminescence-based characterization techniques for solar cells is presented, and the previous work carried out at I.E.S. is summarized. For the development of the practice part it has been necessary to design two drivers using Labview software. The first driver handles the source-meter injecting current in the solar cell and measuring voltage between its terminals. The second driver is used to handle and automate the acquisition of the solar cell electroluminescence image under forward biased conditions, using a CCD sensor. These drivers are included in the final application, which offers the user an interface to apply different bias conditions to the solar cell and for the acquisition of electroluminescence maps. The use of this system is essential in the studies of degradation of solar cells which is currently underway at the I.E.S. – U.P.M. In this Master Final Project the results of the first measurements are carried out which are presented in the final part of this memory.

Advanced Fresnel Köhler concentrators for photovoltaic applications

La concentración fotovoltaica (CPV) es una de las formas más prometedoras de reducir el coste de la energía proveniente del sol. Esto es posible gracias a células solares de alta eficiencia y a una significativa reducción del tamaño de la misma, que está fabricada con costosos materiales semiconductores. Ambos aspectos están íntimamente ligados ya que las altas eficiencias solamente son posibles con materiales y tecnologías de célula caros, lo que forzosamente conlleva una reducción del tamaño de la célula si se quiere lograr un sistema rentable. La reducción en el tamaño de las células requiere que la luz proveniente del sol ha de ser redirigida (es decir, concentrada) hacia la posición de la célula. Esto se logra colocando un concentrador óptico encima de la célula. Estos concentradores para CPV están formados por diferentes elementos ópticos fabricados en materiales baratos, con el fin de reducir los costes de producción. El marco óptimo para el diseño de concentradores es la óptica anidólica u óptica nonimaging. La óptica nonimaging fue desarrollada por primera vez en la década de los años sesenta y ha ido evolucionando significativamente desde entonces. El objetivo de los diseños nonimaging es la transferencia eficiente de energía entre la fuente y el receptor (sol y célula respectivamente, en el caso de la CPV), sin tener en cuenta la formación de imagen. Los sistemas nonimaging suelen ser simples, están compuestos de un menor número de superficies que los sistemas formadores de imagen y son más tolerantes a errores de fabricación. Esto hace de los sistemas nonimaging una herramienta fundamental, no sólo en el diseño de concentradores fotovoltaicos, sino también en el diseño de otras aplicaciones como iluminación, proyección y comunicaciones inalámbricas ópticas. Los concentradores ópticos nonimaging son adecuados para aplicaciones CPV porque el objetivo no es la reproducción de una imagen exacta del sol (como sería el caso de las ópticas formadoras de imagen), sino simplemente la colección de su energía sobre la célula solar. Los concentradores para CPV pueden presentar muy diferentes arquitecturas y elementos ópticos, dando lugar a una gran variedad de posibles diseños. El primer elemento óptico que es atravesado por la luz del sol se llama Elemento Óptico Primario (POE en su nomenclatura anglosajona) y es el elemento más determinante a la hora de definir la forma y las propiedades del concentrador. El POE puede ser refractivo (lente) o reflexivo (espejo). Esta tesis se centra en los sistemas CPV que presentan lentes de Fresnel como POE, que son lentes refractivas delgadas y de bajo coste de producción que son capaces de concentrar la luz solar. El capítulo 1 expone una breve introducción a la óptica geométrica y no formadora de imagen (nonimaging), explicando sus fundamentos y conceptos básicos. Tras ello, la integración Köhler es presentada en detalle, explicando sus principios, válidos tanto para aplicaciones CPV como para iluminación. Una introducción a los conceptos fundamentales de CPV también ha sido incluida en este capítulo, donde se analizan las propiedades de las células solares multiunión y de los concentradores ópticos empleados en los sistemas CPV. El capítulo se cierra con una descripción de las tecnologías existentes empleadas para la fabricación de elementos ópticos que componen los concentradores. El capítulo 2 se centra principalmente en el diseño y desarrollo de los tres concentradores ópticos avanzados Fresnel Köhler que se presentan en esta tesis: Fresnel-Köhler (FK), Fresnel-Köhler curvo (DFK) y Fresnel-Köhler con cavidad (CFK). Todos ellos llevan a cabo integración Köhler y presentan una lente de Fresnel como su elemento óptico primario. Cada uno de estos concentradores CPV presenta sus propias propiedades y su propio procedimiento de diseño. Además, presentan todas las características que todo concentrador ha de tener: elevado factor de concentración, alta tolerancia de fabricación, alta eficiencia óptica, irradiancia uniforme sobre la superficie de la célula y bajo coste de producción. Los concentradores FK y DFK presentan una configuración de cuatro sectores para lograr la integración Köhler. Esto quiere decir que POE y SOE se dividen en cuatro sectores simétricos cada uno, y cada sector del POE trabaja conjuntamente con su correspondiente sector de SOE. La principal diferencia entre los dos concentradores es que el POE del FK es una lente de Fresnel plana, mientras que una lente curva de Fresnel es empleada como POE del DFK. El concentrador CFK incluye una cavidad de confinamiento externo integrada, que es un elemento óptico capaz de recuperar los rayos reflejados por la superficie de la célula con el fin de ser reabsorbidos por la misma. Por tanto, se aumenta la absorción de la luz, lo que implica un aumento en la eficiencia del módulo. Además, este capítulo también explica un método de diseño alternativo para los elementos faceteados, especialmente adecuado para las lentes curvas como el POE del DFK. El capítulo 3 se centra en la caracterización y medidas experimentales de los concentradores ópticos presentados en el capítulo 2, y describe sus procedimientos. Estos procedimientos son en general aplicables a cualquier concentrador basado en una lente de Fresnel, e incluyen tres tipos principales de medidas experimentales: eficiencia eléctrica, ángulo de aceptancia y uniformidad de la irradiancia en el plano de la célula. Los resultados que se muestran a lo largo de este capítulo validarán a través de medidas a sol real las características avanzadas que presentan los concentradores Köhler, y que se demuestran en el capítulo 2 mediante simulaciones de rayos. Cada concentrador (FK, DFK y CFK) está diseñado y optimizado teniendo en cuenta condiciones de operación realistas. Su rendimiento se modela de forma exhaustiva mediante el trazado de rayos en combinación con modelos distribuidos para la célula. La tolerancia es un asunto crítico de cara al proceso de fabricación, y ha de ser máxima para obtener sistemas de producción en masa rentables. Concentradores con tolerancias limitadas generan bajadas significativas de eficiencia a nivel de array, causadas por el desajuste de corrientes entre los diferentes módulos (principalmente debido a errores de alineación en la fabricación). En este sentido, la sección 3.5 presenta dos métodos matemáticos que estiman estas pérdidas por desajuste a nivel de array mediante un análisis de sus curvas I-V, y por tanto siendo innecesarias las medidas a nivel de mono-módulo. El capítulo 3 también describe la caracterización indoor de los elementos ópticos que componen los concentradores, es decir, de las lentes de Fresnel que actúan como POE y de los secundarios free-form. El objetivo de esta caracterización es el de evaluar los adecuados perfiles de las superficies y las transmisiones ópticas de los diferentes elementos analizados, y así hacer que el rendimiento del módulo sea el esperado. Esta tesis la cierra el capítulo 4, en el que la integración Köhler se presenta como una buena alternativa para obtener distribuciones uniformes en aplicaciones de iluminación de estado sólido (iluminación con LED), siendo particularmente eficaz cuando se requiere adicionalmente una buena mezcla de colores. En este capítulo esto se muestra a través del ejemplo particular de un concentrador DFK, el cual se ha utilizado para aplicaciones CPV en los capítulos anteriores. Otra alternativa para lograr mezclas cromáticas apropiadas está basada en un método ya conocido (deflexiones anómalas), y también se ha utilizado aquí para diseñar una lente TIR aplanética delgada. Esta lente cumple la conservación de étendue, asegurando así que no hay bloqueo ni dilución de luz simultáneamente. Ambos enfoques presentan claras ventajas sobre las técnicas clásicas empleadas en iluminación para obtener distribuciones de iluminación uniforme: difusores y mezcla caleidoscópica mediante guías de luz. ABSTRACT Concentrating Photovoltaics (CPV) is one of the most promising ways of reducing the cost of energy collected from the sun. This is possible thanks to both, very high-efficiency solar cells and a large decrease in the size of cells, which are made of costly semiconductor materials. Both issues are closely linked since high efficiency values are only possible with expensive cell materials and technologies, implying a compulsory area reduction if cost-effectiveness is desired. The reduction in the cell size requires that light coming from the sun must be redirected (i.e. concentrated) towards the cell position. This is achieved by placing an optical concentrator system on top of the cell. These CPV concentrators consist of different optical elements manufactured on cheap materials in order to maintain low production costs. The optimal framework for the design of concentrators is nonimaging optics. Nonimaging optics was first developed in the 60s decade and has been largely developed ever since. The aim of nonimaging devices is the efficient transfer of light power between the source and the receiver (sun and cell respectively in the case of CPV), disregarding image formation. Nonimaging systems are usually simple, comprised of fewer surfaces than imaging systems and are more tolerant to manufacturing errors. This renders nonimaging optics a fundamental tool, not only in the design of photovoltaic concentrators, but also in the design of other applications as illumination, projection and wireless optical communications. Nonimaging optical concentrators are well suited for CPV applications because the goal is not the reproduction of an exact image of the sun (as imaging optics would provide), but simply the collection of its energy on the solar cell. Concentrators for CPV may present very different architectures and optical elements, resulting in a vast variety of possible designs. The first optical element that sunlight goes through is called the Primary Optical Element (POE) and is the most determinant element in order to define the shape and properties of the whole concentrator. The POE can be either refractive (lens) or reflective (mirror). This thesis focuses on CPV systems based on Fresnel lenses as POE, which are thin and inexpensive refractive lenses able to concentrate sunlight. Chapter 1 exposes a short introduction to geometrical and nonimaging optics, explaining their fundamentals and basic concepts. Then, the Köhler integration is presented in detail, explaining its principles, valid for both applications: CPV and illumination. An introduction to CPV fundamental concepts is also included in this chapter, analyzing the properties of multijunction solar cells and optical concentrators employed in CPV systems. The chapter is closed with a description of the existing technologies employed for the manufacture of optical elements composing the concentrator. Chapter 2 is mainly devoted to the design and development of the three advanced Fresnel Köhler optical concentrators presented in this thesis work: Fresnel-Köhler (FK), Dome-shaped Fresnel-Köhler (DFK) and Cavity Fresnel-Köhler (CFK). They all perform Köhler integration and comprise a Fresnel lens as their Primary Optical Element. Each one of these CPV concentrators presents its own characteristics, properties and its own design procedure. Their performances include all the key issues in a concentrator: high concentration factor, large tolerances, high optical efficiency, uniform irradiance on the cell surface and low production cost. The FK and DFK concentrators present a 4-fold configuration in order to perform the Köhler integration. This means that POE and SOE are divided into four symmetric sectors each one, working each POE sector with its corresponding SOE sector by pairs. The main difference between both concentrators is that the POE of the FK is a flat Fresnel lens, while a dome-shaped (curved) Fresnel lens performs as the DFK’s POE. The CFK concentrator includes an integrated external confinement cavity, which is an optical element able to recover rays reflected by the cell surface in order to be re-absorbed by the cell. It increases the light absorption, entailing an increase in the efficiency of the module. Additionally, an alternative design method for faceted elements will also be explained, especially suitable for dome-shaped lenses as the POE of the DFK. Chapter 3 focuses on the characterization and experimental measurements of the optical concentrators presented in Chapter 2, describing their procedures. These procedures are in general applicable to any Fresnel-based concentrator as well and include three main types of experimental measurements: electrical efficiency, acceptance angle and irradiance uniformity at the solar cell plane. The results shown along this chapter will validate through outdoor measurements under real sun operation the advanced characteristics presented by the Köhler concentrators, which are demonstrated in Chapter 2 through raytrace simulation: high optical efficiency, large acceptance angle, insensitivity to manufacturing tolerances and very good irradiance uniformity on the cell surface. Each concentrator (FK, DFK and CFK) is designed and optimized looking at realistic performance characteristics. Their performances are modeled exhaustively using ray tracing combined with cell modeling, taking into account the major relevant factors. The tolerance is a critical issue when coming to the manufacturing process in order to obtain cost-effective mass-production systems. Concentrators with tight tolerances result in significant efficiency drops at array level caused by current mismatch among different modules (mainly due to manufacturing alignment errors). In this sense, Section 3.5 presents two mathematical methods that estimate these mismatch losses for a given array just by analyzing its full-array I-V curve, hence being unnecessary any single mono-module measurement. Chapter 3 also describes the indoor characterization of the optical elements composing the concentrators, i.e. the Fresnel lenses acting as POEs and the free-form SOEs. The aim of this characterization is to assess the proper surface profiles and optical transmissions of the different elements analyzed, so they will allow for the expected module performance. This thesis is closed by Chapter 4, in which Köhler integration is presented as a good approach to obtain uniform distributions in Solid State Lighting applications (i.e. illumination with LEDs), being particularly effective when dealing with color mixing requirements. This chapter shows it through the particular example of a DFK concentrator, which has been used for CPV applications in the previous chapters. An alternative known method for color mixing purposes (anomalous deflections) has also been used to design a thin aplanatic TIR lens. This lens fulfills conservation of étendue, thus ensuring no light blocking and no light dilution at the same time. Both approaches present clear advantages over the classical techniques employed in lighting to obtain uniform illumination distributions: diffusers and kaleidoscopic lightpipe mixing.

Low-cost irradiance sensors for irradiation assessments inside tree canopies.

The solar irradiation that a crop receives is directly related to the physical and biological processes that affect the crop. However, the assessment of solar irradiation poses certain problems when it must be measured through fruit inside the canopy of a tree. In such cases, it is necessary to check many test points, which usually requires an expensive data acquisition system. The use of conventional irradiance sensors increases the cost of the experiment, making them unsuitable. Nevertheless, it is still possible to perform a precise irradiance test with a reduced price by using low-cost sensors based on the photovoltaic effect. The aim of this work is to develop a low-cost sensor that permits the measurement of the irradiance inside the tree canopy. Two different technologies of solar cells were analyzed for their use in the measurement of solar irradiation levels inside tree canopies. Two data acquisition system setups were also tested and compared. Experiments were performed in Ademuz (Valencia, Spain) in September 2011 and September 2012 to check the validity of low-cost sensors based on solar cells and their associated data acquisition systems. The observed difference between solar irradiation at high and low positions was of 18.5% ± 2.58% at a 95% confidence interval. Large differences were observed between the operations of the two tested sensors. In the case of a-Si cells based mini-modules, an effect of partial shadowing was detected due to the larger size of the devices, the use of individual c-Si cells is recommended over a-Si cells based mini-modules.

Wide-angle, high-concentration photovoltaics to compete with flat plate systems

A novel photovoltaic concentrator enables highly uniform irradiance on a small number of efficient solar cells. The maximum electrical power of a photovoltaic (PV) energy installation depends on three factors: the available irradiance, the size of the systems collecting sunlight, and the rate at which the device transforms light into electricity (the conversion efficiency). Developers can maximize the irradiance by carefully selecting the site and orientation of the solar facility. But they can only expand their sunlight collection systems for standard flat plate PV devices by increasing the number of solar cells, at greater cost. Here, we consider the advantages of an alternative PV system that produces more energy without increasing the number of cells used (actually, reducing it), by improving the conversion rates.We also present a new device that may enhance the commercial viability of such technologies.

About the origin of low wafer performance and crystal defect generation on seed-cast growth of industrial mono-like silicon ingots

The era of the seed-cast grown monocrystalline-based silicon ingots is coming. Mono-like, pseudomono or quasimono wafers are product labels that can be nowadays found in the market, as a critical innovation for the photovoltaic industry. They integrate some of the most favorable features of the conventional silicon substrates for solar cells, so far, such as the high solar cell efficiency offered by the monocrystalline Czochralski-Si (Cz-Si) wafers and the lower cost, high productivity and full square-shape that characterize the well-known multicrystalline casting growth method. Nevertheless, this innovative crystal growth approach still faces a number of mass scale problems that need to be resolved, in order to gain a deep, 100% reliable and worldwide market: (i) extended defects formation during the growth process; (ii) optimization of the seed recycling; and (iii) parts of the ingots giving low solar cells performance, which directly affect the production costs and yield of this approach. Therefore, this paper presents a series of casting crystal growth experiments and characterization studies from ingots, wafers and cells manufactured in an industrial approach, showing the main sources of crystal defect formation, impurity enrichment and potential consequences at solar cell level. The previously mentioned technological drawbacks are directly addressed, proposing industrial actions to pave the way of this new wafer technology to high efficiency solar cells.

Precipitated iron: a limit on gettering efficacy in multicrystalline silicon

A phosphorus diffusion gettering model is used to examine the efficacy of a standard gettering process on interstitial and precipitated iron in multicrystalline silicon. The model predicts a large concentration of precipitated iron remaining after standard gettering for most as-grown iron distributions. Although changes in the precipitated iron distribution are predicted to be small, the simulated post-processing interstitial iron concentration is predicted to depend strongly on the as-grown distribution of precipitates, indicating that precipitates must be considered as internal sources of contamination during processing. To inform and validate the model, the iron distributions before and after a standard phosphorus diffusion step are studied in samples from the bottom, middle, and top of an intentionally Fe-contaminated laboratory ingot. A census of iron-silicide precipitates taken by synchrotron-based X-ray fluorescence microscopy confirms the presence of a high density of iron-silicide precipitates both before and after phosphorus diffusion. A comparable precipitated iron distribution was measured in a sister wafer after hydrogenation during a firing step. The similar distributions of precipitated iron seen after each step in the solar cell process confirm that the effect of standard gettering on precipitated iron is strongly limited as predicted by simulation. Good agreement between the experimental and simulated data supports the hypothesis that gettering kinetics is governed by not only the total iron concentration but also by the distribution of precipitated iron. Finally, future directions based on the modeling are suggested for the improvement of effective minority carrier lifetime in multicrystalline silicon solar cells.

VentanaTM power train features and performance

Most CPV systems are based on Fresnel lenses. Among these, LPI-patented Fresnel-Köhler (FK) concentrator outstands owing to performance and practical reasons. The VentanaTM power train is the first off-the-shelf commercial product based on the FK and comprises both the primary (POE) lenses (a 36-units 1×1 m2 acrylic panel manufactured by EVONIK and 10×) and glass (or Savosil) secondary optics (SOE). This high concentration optical train (Cg=1,024×, ~250mm optical depth) fits with 5×5 mm2 (at least) solar cells. The optical train is the fruit of a 1-year development that has included design, modeling, prototyping and characterization, and through the process LPI had the opportunity to find out how well the actual performance correlates with models, but also learned practical aspects of a CPV system of this kind, some of which have very positive impact on system performance and reliability.

Estudio de las propiedades mecánicas de obleas de silicio

En esta tesis se propone un procedimiento para evaluar la resistencia mecánica de obleas de silicio cristalino y se aplica en diferentes casos válidos para la industria. En el sector de la industria fotovoltaica predomina la tecnología basada en paneles de silicio cristalino. Estos paneles están compuestos por células solares conectadas en serie y estas células se forman a partir de obleas de silicio. Con el objetivo de disminuir el coste del panel, en los últimos años se ha observado una clara tendencia a la reducción del espesor de las obleas. Esta reducción del espesor modifica la rigidez de las obleas por lo que ha sido necesario modificar la manera tradicional de manipularlas con el objetivo de mantener un bajo ratio de rotura. Para ello, es necesario conocer la resistencia mecánica de las obleas. En la primera parte del trabajo se describen las obleas de silicio, desde su proceso de formación hasta sus propiedades mecánicas. Se muestra la influencia de la estructura cristalográfica en la resistencia y en el comportamiento ya que el cristal de silicio es anisótropo. Se propone también el método de caracterización de la resistencia. Se utiliza un criterio probabilista basado en los métodos de dimensionamiento de materiales frágiles en el que la resistencia queda determinada por los parámetros de la ley de Weibull triparamétrica. Se propone el procedimiento para obtener estos parámetros a partir de campañas de ensayos, modelización numérica por elementos finitos y un algoritmo iterativo de ajuste de los resultados. En la segunda parte de la tesis se describen los diferentes tipos de ensayos que se suelen llevar a cabo con este material. Se muestra además, para cada uno de los ensayos descritos, un estudio comparativo de diferentes modelos de elementos finitos simulando los ensayos. Se comparan tanto los resultados aportados por cada modelo como los tiempos de cálculo. Por último, se presentan tres aplicaciones diferentes donde se ha aplicado este procedimiento de estudio. La primera aplicación consiste en la comparación de la resistencia mecánica de obleas de silicio en función del método de crecimiento del lingote. La resistencia de las tradicionales obleas monocristalinas obtenidas por el método Czochralski y obleas multicristalinas es comparada con las novedosas obleas quasi-monocristalinas obtenidas por métodos de fundición. En la segunda aplicación se evalúa la profundidad de las grietas generadas en el proceso de corte del lingote en obleas. Este estudio se realiza de manera indirecta: caracterizando la resistencia de grupos de obleas sometidas a baños químicos de diferente duración. El baño químico reduce el espesor de las obleas eliminando las capas más dañadas. La resistencia de cada grupo es analizada y la comparación permite obtener la profundidad de las grietas generadas en el proceso de corte. Por último, se aplica este procedimiento a un grupo de obleas con características muy especiales: obleas preparadas para formar células de contacto posterior EWT. Estas obleas presentan miles de agujeros que las debilitan considerablemente. Se aplica el procedimiento de estudio propuesto con un grupo de estas obleas y se compara la resistencia obtenida con un grupo de referencia. Además, se propone un método simplificado de estudio basado en la aplicación de una superficie de intensificación de tensiones. ABSTRACT In this thesis, a procedure to evaluate the mechanical strength of crystalline silicon wafers is proposed and applied in different studies. The photovoltaic industry is mainly based on crystalline silicon modules. These modules are composed of solar cells which are based on silicon wafers. Regarding the cost reduction of solar modules, a clear tendency to use thinner wafers has been observed during last years. Since the stiffness varies with thickness, the manipulation techniques need to be modified in order to guarantee a low breakage rate. To this end, the mechanical strength has to be characterized correctly. In the first part of the thesis, silicon wafers are described including the different ways to produce them and the mechanical properties of interest. The influence of the crystallographic structure in the strength and the behaviour (the anisotropy of the silicon crystal) is shown. In addition, a method to characterize the mechanical strength is proposed. This probabilistic procedure is based on methods to characterize brittle materials. The strength is characterized by the values of the three parameters of the Weibull cumulative distribution function (cdf). The proposed method requires carrying out several tests, to simulate them through Finite Element models and an iterative algorithm in order to estimate the parameters of the Weibull cdf. In the second part of the thesis, the different types of test that are usually employed with these samples are described. Moreover, different Finite Element models for the simulation of each test are compared regarding the information supplied by each model and the calculation times. Finally, the method of characterization is applied to three examples of practical applications. The first application consists in the comparison of the mechanical strength of silicon wafers depending on the ingot growth method. The conventional monocrystalline wafers based on the Czochralski method and the multicrystalline ones are compared with the new quasi-monocrystalline substrates. The second application is related to the estimation of the crack length caused by the drilling process. An indirect way is used to this end: several sets of silicon wafers are subjected to chemical etchings of different duration. The etching procedure reduces the thickness of the wafers removing the most damaged layers. The strength of each set is obtained by means of the proposed method and the comparison permits to estimate the crack length. At last, the procedure is applied to determine the strength of wafers used for the design of back-contact cells of type ETW. These samples are drilled in a first step resulting in silicon wafers with thousands of tiny holes. The strength of the drilled wafers is obtained and compared with the one of a standard set without holes. Moreover, a simplified approach based on a stress intensification surface is proposed.