638 resultados para titanium corrosion


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The results of a study of the variation in photocatalytic activity of TiO2, as measured by its ability to photomineralise 4-chlorophenol, as a function of temperature used to anneal the TiO2, are reported. Heat treatment of the TiO2 leads to a marked decrease in its photocatalytic activity at annealing temperatures above 600-degrees-C. This decrease is associated with a concomitant drop in the specific surface area of the TiO2, owing to particle sintering, rather than the anatase to rutile transformation, which occurs largely at temperatures above 700-degrees-C. There is a reasonable correlation between photocatalytic activity and the surface area of the aggregate particles in the dispersions of the different heat-treated TiO2 samples.

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The kinetics of photomineralization of 4-chlorophenol (4-CP) sensitized by Degussa P25 TiO2 in O2-saturated solution is studied as a function of the following different experimental parameters: pH, [TiO2], percentage O2 [O2], [4-CP], T, I, lambda and [KNO3]. At pH 2 and T=30-degrees-C the initial relative rate of CO2 photogeneration R(CO2) conforms to a Langmuir-Hinshelwood-type kinetic scheme and the relationship between R(CO2) and the various experimental parameters may be summarized as follows: R(CO2) = gammaK(O2)[O2](I(a))(theta)K(4-CP]0/(1 + K(O2])(1 + K(4-CP)[4-CP]0) where gamma is a proportionality constant, K(O2) = 0.044 +/- 0.005[O2]-1, theta = 0.74 +/- 0.05 and K(4-CP) = (29 +/- 3) x 10(3) dm3 mol-1. The overall activation energy for this photosystem was determined as 16 +/- 2 kJ mol-1. This work forms part of an overall characterization study in which it is proposed that the 4-CP-TiO2-O2 photosystem is adopted as a standard test system for incorporation into all future semiconductor-sensitized photomineralization studies in order to facilitate comparisons between the results of the different studies.

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The photomineralisation of 4-chlorophenol (4-CP) sensitised by Degussa P25 TiO2 in O2-saturated solution represents a possible standard test system in semiconductor-sensitised photomineralisation studies. As part of a detailed examination of this photosystem, the results of the temporal variations in the concentrations of 4-CP, CO2, Cl- and the major organic intermediates, namely, 4-chlorocatechol (4-CC), hydroquinone (HQ), benzoquinone and 4-chlororesorcinol, are reported. The observed variations in [4-CP], [4-CC], [HQ] and [CO2] fit those predicted by a kinetic model which utilises kinetic equations with a Langmuir-Hinshelwood form and assumes that there are three major possible routes in which the photogenerated hydroxyl radicals can react with 4-CP, ie. 4-CP --> 4-CC, 4-CP --> HQ and 4-CP --> (unstable intermediate) --> CO2 and that these routes have the following probabilities of occurring: 48%, 10% and 42%.

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The kinetics of oxidative dissolution of RuO2 .xH2O to RuO4 by Ce(iv) ions are studied. Under conditions of a low [Ce(iv)] : [RuO2 .xH2O] ratio (e.g. 0.35 : 1) and a high background concentration of Ce(III) ions (which impede dissolution) the initial reduction of Ce(iv) ions is due to charging of the RuO2 .xH2O microelectrode particles. The initial rate of charging depends directly upon [RuO2 .xH2O] and has an activation energy of 25 +/- 5 kJ mol-1 Under conditions of a high [Ce(iv] : [RuO2 .xH2O] (e.g. 9 : 1) and a low background [Ce(III] the reduction of Ce(iv) ions is almost totally associated with the dissolution of RuO2 .xH2O to RuO4, i.e. not charging. The kinetics of dissolution obey an electrochemical model in which the reduction of Ce(iv) ions and the oxidation of RuO2 .xH2O to RuO4 are assumed to be highly reversible and irreversible processes, respectively, mediated by dissolving the microelectrode particles of RuO2 .xH2O. Assuming this electrochemical model, from an analysis of the kinetics of dissolution the activation energy for this process was estimated to be 39 +/- 5 kJ mol-1 and the Tafel slope for RuO2 .xH2O corrosion was calculated to be 15 mV per decade. The mechanistic implications of these results are discussed.