New data on the specular reflectance of ores (VNIR: 400 - 1000 nm) and their significance for ore microscopy

This work is part of the project CAMEVA for the development of an expert system aimed at the automatic identification of ores [1, 2]. It relies on the measure of their reflectance values, R, on digital images. Software for calibration, acquisition and analysis of the multispectral data was designed by AITEMIN [3]; the research was also assessed by H.J. Bernhardt and E. Pirard [1].

Fabrication of sub-100 nm IDT SAW devices on insulating, semiconducting and conductive substrates

This work describes the electron-beam (e-beam) lithography process developed to manufacture nano interdigital transducers (IDTs) to be used in high frequency (GHz) surface acoustic wave (SAW) applications. The combination of electron-beam (e-beam) lithography and lift-off process is shown to be effective in fabricating well-defined IDT finger patterns with a line width below 100 nm with a good yield. Working with insulating piezoelectric substrates brings about e-beam deflection. It is also shown how a very thin organic anti-static layer works well in avoiding this charge accumulation during e-beam lithography on the resist layer. However, the use of this anti-static layer is not required with the insulating piezoelectric layer laying on a semiconducting substrate such as highly doped silicon. The effect of the e-beam dose on a number of different layers (of insulating, insulating on semiconducting, semiconducting, and conductive natures) is provided. Among other advantages, the use of reduced e-beam doses increases the manufacturing time. The principal aim of this work is to explain the interrelation among e-beam dose, substrate nature and IDT structure. An extensive study of the e-beam lithography of long IDT-fingers is provided, in a wide variety of electrode widths, electrode numbers and electrode pitches. It is worthy to highlight that this work shows the influence of the e-beam dose on five substrates of different conductive nature

Estudio general de la sierra de Espuña : proyecto de ordenación del monte núm. 28, "Huerta de Espuña"

En este trabajo hacemos un estudio general de toda la Sierra de España, así como de la masa que la cubre. Ahora bien, respecto a la Ordenación propiamente dicha y valoración, solo hemos hecho el Proyecto de uno de sus Montes, catalogado con el número 28 y denominado «Huerta de Espuña»», ya que ante la premura del tiempo, empezamos la elaboración de este trabajo sin tener los; datos completos de las existencias de los demás Montes que con el anterior constituyen esta Sierra; no obstante, en todos los apartados del Capítulo de Ordenación que podemos hacerlo, nos referimos a la totalidad del Grupo de Montes que componen la mencionada Sierra de Espuña.

Nondestructive quantification of chemical and physical properties of fruits by time-resolved reflectance spectroscopy in the wavelength range 650-1000 nm

Time-resolved reflectance spectroscopy can be used to assess nondestructively the bulk (rather than the superficial) optical properties of highly diffusive media. A fully automated system for time-resolved reflectance spectroscopy was used to evaluate the absorption and the transport scattering spectra of fruits in the red and the near-infrared regions. In particular, data were collected in the range 650-1000 nm from three varieties of apples and from peaches, kiwifruits, and tomatoes. The absorption spectra were usually dominated by the water peak near 970 nm, whereas chlorophyll was detected at 675 nm. For ail species the scattering decreased progressively with increasing wavelength. A best fit to water and chlorophyll absorption line shapes and to Mie theory permitted the estimation of water and chlorophyll content and the average size of scattering centers in the bulls; of intact fruits.

High-frequency signal generation using 1550 nm VCSEL subject to two-frequency optical injection

We experimentally investigate high-frequency microwave signal generation using a 1550 nm single-mode VCSEL subject to two-frequency optical injection. We first consider a situation in which the injected signals come from two similar VCSELs. The polarization of the injected light is parallel to that of the injected VCSEL. We obtain that the VCSEL can be locked to one of the injected signals, but the observed microwave signal is originated by beating at the photodetector. In a second situation we consider injected signals that come from two external cavity tunable lasers with a significant increase of the injected power with respect to the VCSEL-by-VCSEL injection case. The polarization of the injected light is orthogonal to that of the free-running slave VCSEL. We show that in this case it is possible to generate a microwave signal inside the VCSEL cavity. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

High data rate modulation of high power 1060-nm DBR tapered lasers with separate contacts

Direct optical modulation at 2.5 Gb/s with amplitude of more than 0.5 W has been demonstrated in single longitudinal mode distributed Bragg reflector tapered lasers emitting at 1060 nm with separated injection of the ridge waveguide and tapered sections. The modulating signal of ~110 mA peak to peak was applied to the ridge waveguide section, yielding a high modulation efficiency of ~5 W/A. The large-signal frequency response of the experimental set-up was limited by the bandwidth of the electrical amplifier rather than by the internal dynamics of the laser, indicating that higher bit rates could be achieved with improved driving electronics.

Microwave signal generation using a dual-beam optically injected 1550 nm VCSEL

We report microwave signal generation using a 1550 nm single-mode VCSEL subject to two-frequency optical injection. Double injection locking is achieved. It is found that this generation system is independent of the master lasers polarization.

Alegación por la casa-banco conocida bajo la razon de Rothschild hermanos, de Paris, en el pleito ... de quiebra de la sociedad metalúrgica La Británica establecida en Alicante que ... pende ... de esta Audiencia territorial entre los herederos del ... señor Don Pio Pita Pizarro, los Síndicos de la quiebra, y la referida casa de Rothschild sobre liquidacion de la cuenta de plata núm. 1º presentada á la junta de acreedores por ésta

Las h. pleg. contienen: Testimonios de la cuentas de Rothschild

Using pMOS Pass-Gates to Boost SRAM Performance by Exploiting Strain Effects in Sub-20-nm FinFET Technologies

Strained fin is one of the techniques used to improve the devices as their size keeps reducing in new nanoscale nodes. In this paper, we use a predictive technology of 14 nm where pMOS mobility is significantly improved when those devices are built on top of long, uncut fins, while nMOS devices present the opposite behavior due to the combination of strains. We explore the possibility of boosting circuit performance in repetitive structures where long uncut fins can be exploited to increase fin strain impact. In particular, pMOS pass-gates are used in 6T complementary SRAM cells (CSRAM) with reinforced pull-ups. Those cells are simulated under process variability and compared to the regular SRAM. We show that when layout dependent effects are considered the CSRAM design provides 10% to 40% faster access time while keeping the same area, power, and stability than a regular 6T SRAM cell. The conclusions also apply to 8T SRAM cells. The CSRAM cell also presents increased reliability in technologies whose nMOS devices have more mismatch than pMOS transistors.

Determination of chromite composition from multispectral reflectance measurements (400-1000 nm)

The relationship between the chemical composition and the multispectral reflectance values of chromite in the VNIR (Visible and Near-Infra-Red) realm is tested and mathematically analysed. Statisticaltools as Pearson's correlation coefficients, linear stepwise regression analysis and least-square adjustments are applied to two populations of data obtained from 14 selected samples 01 chromite multielemental microprobe analysis and multispectral reflectance values (400-1 000 nm). Results show that both data sets correlate, and suggest that the VNIR reflectance spectra can be used as a tool to determine the chemical composition of chromites.