916 resultados para Scan rates


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The principle of step-scan Fourier transform infrared (FTIR) spectroscopy is introduced. Double modulation step-scan FTIR technique is used to obtain the quantum cascade laser's stacked emission spectra in the time domain. Optical property and thermal accumulation of devices due to large drive current are analyzed.

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Scan test can be inserted around hard IP cores that have not been designed with DFT approaches. An 18x18 bits Booth Coding-Wallace Tree multiplier has been designed with full custom approach with 0.61 m CMOS technology. When we reuse the multiplier in another chip, scan chain has been inserted around it to increase the fault coverage. After scan insertion, the multiplier needs 4.7% more areas and 24.4% more delay time, while the fault coverage reaches to 95%.