Linear regression under fixed-rank constraints: A Riemannian approach

In this paper, we tackle the problem of learning a linear regression model whose parameter is a fixed-rank matrix. We study the Riemannian manifold geometry of the set of fixed-rank matrices and develop efficient line-search algorithms. The proposed algorithms have many applications, scale to high-dimensional problems, enjoy local convergence properties and confer a geometric basis to recent contributions on learning fixed-rank matrices. Numerical experiments on benchmarks suggest that the proposed algorithms compete with the state-of-the-art, and that manifold optimization offers a versatile framework for the design of rank-constrained machine learning algorithms. Copyright 2011 by the author(s)/owner(s).

Tandem system adaptation using multiple linear feature transforms

Adaptation to speaker and environment changes is an essential part of current automatic speech recognition (ASR) systems. In recent years the use of multi-layer percpetrons (MLPs) has become increasingly common in ASR systems. A standard approach to handling speaker differences when using MLPs is to apply a global speaker-specific constrained MLLR (CMLLR) transform to the features prior to training or using the MLP. This paper considers the situation when there are both speaker and channel, communication link, differences in the data. A more powerful transform, front-end CMLLR (FE-CMLLR), is applied to the inputs to the MLP to represent the channel differences. Though global, these FE-CMLLR transforms vary from time-instance to time-instance. Experiments on a channel distorted dialect Arabic conversational speech recognition task indicates the usefulness of adapting MLP features using both CMLLR and FE-CMLLR transforms. © 2013 IEEE.

The mean value concept in mono-linear regression of multi-variables and its application to trace studies in geosciences

IEECAS SKLLQG

On Regression Methods for Virtual Metrology in Semiconductor Manufacturing

Virtual metrology (VM) aims to predict metrology values using sensor data from production equipment and physical metrology values of preceding samples. VM is a promising technology for the semiconductor manufacturing industry as it can reduce the frequency of in-line metrology operations and provide supportive information for other operations such as fault detection, predictive maintenance and run-to-run control. The prediction models for VM can be from a large variety of linear and nonlinear regression methods and the selection of a proper regression method for a specific VM problem is not straightforward, especially when the candidate predictor set is of high dimension, correlated and noisy. Using process data from a benchmark semiconductor manufacturing process, this paper evaluates the performance of four typical regression methods for VM: multiple linear regression (MLR), least absolute shrinkage and selection operator (LASSO), neural networks (NN) and Gaussian process regression (GPR). It is observed that GPR performs the best among the four methods and that, remarkably, the performance of linear regression approaches that of GPR as the subset of selected input variables is increased. The observed competitiveness of high-dimensional linear regression models, which does not hold true in general, is explained in the context of extreme learning machines and functional link neural networks.