931 resultados para Tree diagram
Resumo:
Scan test can be inserted around hard IP cores that have not been designed with DFT approaches. An 18x18 bits Booth Coding-Wallace Tree multiplier has been designed with full custom approach with 0.61 m CMOS technology. When we reuse the multiplier in another chip, scan chain has been inserted around it to increase the fault coverage. After scan insertion, the multiplier needs 4.7% more areas and 24.4% more delay time, while the fault coverage reaches to 95%.
Resumo:
IEECAS SKLLQG
Resumo:
IEECAS SKLLQG
Resumo:
IEECAS SKLLQG
Resumo:
IEECAS SKLLQG
Resumo:
IEECAS SKLLQG