Síntese de filmes híbridos de SI/PMMA-DR1 por processo sol-gel e caracterização

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Um estudo do efeito da composição dos vidros teluretos sobre os índices de refração linear e não linear

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Novas técnicas de detecção de fase óptica em interferômetros homódinos aplicadas à caracterização de atuadores piezoelétricos flextensionais

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Avaliação clínica dos efeitos da associação do peróxido de hidrogênio a 38% com o peróxido de carbamida a 10%

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Geração de segundo harmônico em vidros teluritos TeO2 – LiNbO3

Pós-graduação em Ciência dos Materiais - FEIS

Efeito da incorporação de flúor nas propriedades de superfície de filmes DE aC:H

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Novas configurações de interferômetros de quadratura e de técnicas de detecção de fase óptica baseadas em phase unwrapping

Pós-graduação em Engenharia Elétrica - FEIS

Nanometer Scale Titanium Surface Texturing Are Detected by Signaling Pathways Involving Transient FAK and Src Activations

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Writing saturated holograms in LiNbO3 crystals through phase control and double diffraction

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Processo de esmerilhamento, polimento e caracterização de um Shear Plate

Shearplate is an optical glass plate having two flat surfaces and a small angle between them. The use of a high quality shear plate is essential to implement shear interferometric technique . The shear interferometry is a technique used to evaluate the light beam collimation. In order to guarantee the shearplate quality , the complete manufacturing process must be thoroughly monitored. In the manufacturing process, the first step consisted of the glass selection. The selected glass has been submitted to the process of cutting, gluing, chamfering, grinding and polishing. Each phase has been strictly monitored. The quality of the final result depends extremely on an appropriate starting condition, which arises from the grinding process, as the polishing process only recovers the brightness of the part, acting on a small scale on the wearing off of the part, as well as not changing the structured obtained in the grinding process. Respecting all stages of the manufacturing process, the quality of the part has evolved to a good result. The best result obtained showed PV distance of 162 nm, slightly less than λ / 4. This result is significant because the dimensions of the piece with respect to the dimensions of the polisher what interferes directly in the results. The closer are the dimensions of piece and the dimensions of the polisher, the greater the difficulty in controlling the propagation of errors

Laser irradiation and thermal treatment inducing selective crystallization in Sb2O3-Sb2S3 glassy films

The influence of both thermal treatment and laser irradiation on the structural and optical properties of films in the Sb 2 O 3 –Sb 2 S 3 system was investigated. The films were prepared by RF-sputtering using glass compositions as raw materials. Irreversible photodarkening effect was observed after exposure the films to a 458nm solid state laser. It is shown, for the first time, the use of holographic technique to measure “in situ”, simultaneously and independently, the phase and amplitude modulations in glassy films. The films were also photo-crystallized and analysed “in situ” using a laser coupled to a micro-Raman equipment. Results showed that Sb 2 S 3 crystalline phase was obtained after irradiation. The effect of thermal annealing on the structure of the films was carried out. Different from the result obtained by irradiation, thermal annealing induces the crystallization of the Sb 2 O 3 phase. Photo and thermal induced effects on films were studied using UV–Vis and Raman spectroscopy, atomic force microscopy (AFM), thermal analysis (DSC), X-ray diffraction, scanning electron microscopy (MEV) and energy-dispersive X-ray spectroscopy (EDX).

Michelson interferometer vibrometer using self-correcting synthetic-heterodyne demodulation

Synthetic-heterodyne demodulation is a useful technique for dynamic displacement and velocity detection in interferometric sensors, as it can provide an output signal that is immune to interferometric drift. With the advent of cost-effective, high-speed real-time signal-processing systems and software, processing of the complex signals encountered in interferometry has become more feasible. In synthetic heterodyne, to obtain the actual dynamic displacement or vibration of the object under test requires knowledge of the interferometer visibility and also the argument of two Bessel functions. In this paper, a method is described for determining the former and setting the Bessel function argument to a set value, which ensures maximum sensitivity. Conventional synthetic-heterodyne demodulation requires the use of two in-phase local oscillators; however, the relative phase of these oscillators relative to the interferometric signal is unknown. It is shown that, by using two additional quadrature local oscillators, a demodulated signal can be obtained that is independent of this phase difference. The experimental interferometer is aMichelson configuration using a visible single-mode laser, whose current is sinusoidally modulated at a frequency of 20 kHz. The detected interferometer output is acquired using a 250 kHz analog-to-digital converter and processed in real time. The system is used to measure the displacement sensitivity frequency response and linearity of a piezoelectric mirror shifter over a range of 500 Hz to 10 kHz. The experimental results show good agreement with two data-obtained independent techniques: the signal coincidence and denominated n-commuted Pernick method.

Lensometry by two-laser holography with photorefractive Bi12TiO20

Refractive and profilometric measurements of lenses were performed through holography with a photorefractive Bi12TiO20 crystal as the recording medium. Two properly aligned diode lasers emitting in the red region were employed as light sources. Both lasers were tuned in order to provide millimetric and sub-millimetric synthetic wavelengths. The surfaces of the test lens were covered by a 25-μm opaque plastic tape in order to allow the lens profilometry upon illuminating them with a collimated beam. The resulting holographic images appear covered by interference fringes corresponding to the wavefront geometry of the wave scattered by the lens. For refractive index measurement a diffusely scattering flat surface was positioned behind the uncovered lens which was also illuminated by a plane wave. The resulting contour interferogram describes the form of the wavefront after the beam traveled back and forth through the lens. The fringe quantitative evaluation was carried out through the four-stepping technique and the resulting phase map and the Branch-cut method was employed for phase unwrapping. The only non-optical procedure for lens characterization was the thickness measurement, made by a dial caliper. Exact ray tracing calculation was performed in order to establish a relation between the output wavefront geometry and the lens parameters like radii of curvature, thickness and refractive index. By quantitatively comparing the theoretical wavefront geometry with the experimental results relative uncertainties bellow 3% for refractive index and 1 % for focal length were obtained. © 2008 American Institute of Physics.

Compact setup for reflection holography with Bi12TiO 20 crystals

A novel optical setup for imaging through reflection holography with Bi12TiO20 (BTO) sillenite photorefractive crystals is proposed. Aiming a compact, robust and simple optical setup the lensless Denisiuk arrangement was chosen, using a He-Ne red laser as light source. In this setup the holographic medium is placed between the light source and the object. The beam impinging the crystal front face is the reference one, while the light scattered by the surface is the object beam in a holographic recording by diffusion. In order to allow the readout of the diffracted wave only and to keep the setup simplicity a polarizing beam splitter cube (PBS) was positioned at the BTO input. The reference beam is s-polarized (polarization direction perpendicular to the table top) and the crystal. 〈001〉-axis is rotated by an angle γ with respect to the input polarization in order to make the transmitted object beam and the diffracted beam to have orthogonal polarizations. While the transmitted wave is reflected by the PBS at a right angle, the diffracted wave carrying the holographic reconstruction of the object passes through the PBS, being collected by a positive lens in order to form the holographic image at a CCD camera. The holographic recording with the grating vector is parallel to the 〈100〉-axis. An expression for the diffracted wave intensity as a function of γ was derived, and this relation was experimentally investigated. © 2008 American Institute of Physics.

Medição interferométrica de fase óptica através do método de segmentação do sinal amostrado

Pós-graduação em Engenharia Elétrica - FEIS