Biblioteca Digital

962 resultados para Correlative microscopy

Photon emission from Si(111)-(7 x 7) induced by scanning tunneling microscopy: atomic scale and material contrast

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Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light

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Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum

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Atomic force microscopy at solid-liquid interfaces

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Simultaneous force and conduction measurements in atomic force microscopy

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Remote microscopy in the real world

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In-situ scanning tunnelling microscopy of hydrogenated amorphous silicon and microcrystalline silicon

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FIRST A.I.D.: using remote microscopy and artificial intelligence for SEM fault diagnosis

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Lateral stiffness of the tip and tip-sample contact in frictional force microscopy

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A transmission electron microscopy study of the crystallinity and secondary phase formation in melt processed YBa2Cu3O7-δ

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High-temperature scanning tunneling microscopy study of the Li/Si(111) surface

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Study of shear force as a distance regulation mechanism for scanning near-field optical microscopy

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Atomic force microscopy stress sensors for studies in liquids

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A normal force distance regulation scheme for near-field optical microscopy

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Conducting atomic force microscopy study of silicon dioxide breakdown

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