Joint conomic design of (x)over-bar and R charts under Weibull shock models

This paper deals with the joint economic design of (x) over bar and R charts when the occurrence times of assignable causes follow Weibull distributions with increasing failure rates. The variable quality characteristic is assumed to be normally distributed and the process is subject to two independent assignable causes (such as tool wear-out, overheating, or vibration). One cause changes the process mean and the other changes the process variance. However, the occurrence of one kind of assignable cause does not preclude the occurrence of the other. A cost model is developed and a non-uniform sampling interval scheme is adopted. A two-step search procedure is employed to determine the optimum design parameters. Finally, a sensitivity analysis of the model is conducted, and the cost savings associated with the use of non-uniform sampling intervals instead of constant sampling intervals are evaluated.

Joint (X)over-bar and R charts with two-stage samplings

When joint (X) over bar and R charts are in use, samples of fixed size are regularly taken from the process, and their means and ranges are plotted on the (X) over bar and R charts, respectively. In this article, joint (X) over bar and R charts have been used for monitoring continuous production processes. The sampling is performed, in two stages. During the first stage, one item of the sample is inspected and, depending on the result, the sampling is interrupted if the process is found to be in control; otherwise, it goes on to the second stage, where the remaining sample items are inspected. The two-stage sampling procedure speeds up the detection of process disturbances. The proposed joint (X) over bar and R charts are easier to administer and are more efficient than the joint (X) over bar and R charts with variable sample size where the quality characteristic of interest can be evaluated either by attribute or variable. Copyright (C) 2004 John Wiley Sons, Ltd.

Economic design of two-stage (X)over-bar charts: the Markov chain approach

When the (X) over bar chart is in use, samples are regularly taken from the process, and their means are plotted on the chart. In some cases, it is too expensive to obtain the X values, but not the values of a correlated variable Y. This paper presents a model for the economic design of a two-stage control chart, that is. a control chart based on both performance (X) and surrogate (Y) variables. The process is monitored by the surrogate variable until it signals an out-of-control behavior, and then a switch is made to the (X) over bar chart. The (X) over bar chart is built with central, warning. and action regions. If an X sample mean falls in the central region, the process surveillance returns to the (Y) over bar chart. Otherwise. The process remains under the (X) over bar chart's surveillance until an (X) over bar sample mean falls outside the control limits. The search for an assignable cause is undertaken when the performance variable signals an out-of-control behavior. In this way, the two variables, are used in an alternating fashion. The assumption of an exponential distribution to describe the length of time the process remains in control allows the application of the Markov chain approach for developing the cost function. A study is performed to examine the economic advantages of using performance and surrogate variables. (C) 2003 Elsevier B.V. All rights reserved.

(X)OVER-BAR CHARTS WITH VARIABLE SAMPLE-SIZE

The usual practice in using a control chart to monitor a process is to take samples of size n from the process every h hours This article considers the properties of the XBAR chart when the size of each sample depends on what is observed in the preceding sample. The idea is that the sample should be large if the sample point of the preceding sample is close to but not actually outside the control limits and small if the sample point is close to the target. The properties of the variable sample size (VSS) XBAR chart are obtained using Markov chains. The VSS XBAR chart is substantially quicker than the traditional XBAR chart in detecting moderate shifts in the process.

VSSI (X)over-bar charts with sampling at fixed times

A standard (X) over bar chart for controlling the process mean takes samples of size no at specified, equally-spaced, fixed-time points. This article proposes a modification of the standard (X) over bar chart that allows one to take additional samples, bigger than no, between these fixed times. The additional samples are taken from the process when there is evidence that the process mean moved from target. Following the notation proposed by Reynolds (1996a) and Costs (1997) we shortly call the proposed (X) over bar chart as VSSIFT (X) over bar chart: where VSSIFT means variable sample size and sampling intervals with fixed times. The (X) over bar chart with the VSSIFT feature is easier to be administered than a standard VSSI (X) over bar chart that is not constrained to sample at the specified fixed times. The performances of the charts in detecting process mean shifts are comparable.

Economic design of (X)over-bar charts with variable parameters: the Markov chain approach

This paper presents an economic design of (X) over bar control charts with variable sample sizes, variable sampling intervals, and variable control limits. The sample size n, the sampling interval h, and the control limit coefficient k vary between minimum and maximum values, tightening or relaxing the control. The control is relaxed when an (X) over bar value falls close to the target and is tightened when an (X) over bar value falls far from the target. A cost model is constructed that involves the cost of false alarms, the cost of finding and eliminating the assignable cause, the cost associated with production in an out-of-control state, and the cost of sampling and testing. The assumption of an exponential distribution to describe the length of time the process remains in control allows the application of the Markov chain approach for developing the cost function. A comprehensive study is performed to examine the economic advantages of varying the (X) over bar chart parameters.

The Variable Sample Size (X)over-bar Chart with Estimated Parameters

The VSS X chart, dedicated to the detection of small to moderate mean shifts in the process, has been investigated by several researchers under the assumption of known process parameters. In practice, the process parameters are rarely known and are usually estimated from an in-control Phase I data set. In this paper, we evaluate the (run length) performances of the VSS chart when the process parameters are estimated, we compare them in the case where the process parameters are assumed known and we propose specific optimal control chart parameters taking the number of Phase I samples into account.

A hierarchy of adaptive (X)over-bar control charts

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Quenching of para-H-2 with an ultracold antihydrogen atom (H)over-bar(1s)

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Stringent limits on top-quark compositeness from t(t)over-bar production at the Tevatron and the LHC

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Some Comments Regarding the Synthetic (X)over-bar Chart

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Transverse-momentum and pseudorapidity distributions of charged hadrons in pp collisions at root s=0.9 and 2.36 TeV

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

The steady-state behavior of the synthetic and side-sensitive synthetic double sampling (X)over-bar charts

The steady-state average run length is used to measure the performance of the recently proposed synthetic double sampling (X) over bar chart (synthetic DS chart). The overall performance of the DS X chart in signaling process mean shifts of different magnitudes does not improve when it is integrated with the conforming run length chart, except when the integrated charts are designed to offer very high protection against false alarms, and the use of large samples is prohibitive. The synthetic chart signals when a second point falls beyond the control limits, no matter whether one of them falls above the centerline and the other falls below it; with the side-sensitive feature, the synthetic chart does not signal when they fall on opposite sides of the centerline. We also investigated the steady-state average run length of the side-sensitive synthetic DS X chart. With the side-sensitive feature, the overall performance of the synthetic DS X chart improves, but not enough to outperform the non-synthetic DS X chart. Copyright (C) 2014 John Wiley &Sons, Ltd.

Bell inequalities for K-0(K)over-bar(0) pairs from Phi-resonance decays

We analyze the premises of recent propositions to test local realism via the Bell inequalities using neutral kaons from φ resonance decays as entangled Einstein-Podolsky-Rosen pairs. We pay special attention to the derivation of the Bell inequalities, or related expressions, for unstable and oscillating kaon quasispin states and to the possibility of the actual identification of these states through their associated decay modes. We discuss an indirect method to extract probabilities to find these states by combining experimental information with theoretical input. However, we still find inconsistencies in previous derivations of the Bell inequalities. We show that the identification of the quasispin states via their associated decay mode does not allow the free choice to perform different tests on them, a property which is crucial to establish the validity of any Bell inequality in the context of local realism. In view of this we propose a different kind of Bell inequality in which the free choice or adjustability of the experimental setup is guaranteed. We also show that the proposed inequalities are violated by quantum mechanics. ©1999 The American Physical Society.

Anomalous Higgs boson contribution to e(+)e(-)->b(b)over-bar gamma at CERN LEP 2

We study the effect of anomalous Hγγ and HZγ couplings, described by a general effective Lagrangian, on the process e+e-→bb̄γ at CERN LEP 2 energies. We include the relevant irreducible standard model background to this process, and from the photon energy spectrum, we determine the reach of LEP 2 to unravel the anomalous couplings by analyzing the significance of the signal for a Higgs boson with a mass up to 150 GeV.