TDM modelling and evaluation of different domain transforms for LSI

Latent semantic indexing (LSI) is a popular technique used in information retrieval (IR) applications. This paper presents a novel evaluation strategy based on the use of image processing tools. The authors evaluate the use of the discrete cosine transform (DCT) and Cohen Daubechies Feauveau 9/7 (CDF 9/7) wavelet transform as a pre-processing step for the singular value decomposition (SVD) step of the LSI system. In addition, the effect of different threshold types on the search results is examined. The results show that accuracy can be increased by applying both transforms as a pre-processing step, with better performance for the hard-threshold function. The choice of the best threshold value is a key factor in the transform process. This paper also describes the most effective structure for the database to facilitate efficient searching in the LSI system.

PLS modelling and fault detection on the Tennessee Eastman benchmark

This paper describes the application of multivariate regression techniques to the Tennessee Eastman benchmark process for modelling and fault detection. Two methods are applied : linear partial least squares, and a nonlinear variant of this procedure using a radial basis function inner relation. The performance of the RBF networks is enhanced through the use of a recently developed training algorithm which uses quasi-Newton optimization to ensure an efficient and parsimonious network; details of this algorithm can be found in this paper. The PLS and PLS/RBF methods are then used to create on-line inferential models of delayed process measurements. As these measurements relate to the final product composition, these models suggest that on-line statistical quality control analysis should be possible for this plant. The generation of `soft sensors' for these measurements has the further effect of introducing a redundant element into the system, redundancy which can then be used to generate a fault detection and isolation scheme for these sensors. This is achieved by arranging the sensors and models in a manner comparable to the dedicated estimator scheme of Clarke et al. 1975, IEEE Trans. Pero. Elect. Sys., AES-14R, 465-473. The effectiveness of this scheme is demonstrated on a series of simulated sensor and process faults, with full detection and isolation shown to be possible for sensor malfunctions, and detection feasible in the case of process faults. Suggestions for enhancing the diagnostic capacity in the latter case are covered towards the end of the paper.