988 resultados para QQQQ(Q)OVER-BAR COMPONENTS


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The pion electromagnetic form factor is calculated with a light-front quark model. The plus and minus components of the electromagnetic current are used to calculate the electromagnetic form factor in the the Breit frame with two models for the q (q) over bar vertex. The light-front constituent quark model describes very well the hadronic wave functions for pseudo-scalar and vector particles. Symmetry problems arising in the light-front approcah are solved by the pole dislocation method. The results are compared with new experimental data and with other quark models.

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We present the results of a search for a new particle X produced in p (p) over bar collisions at root s- = 1.96 TeV and subsequently decaying to Z gamma. The search uses 0.3 fb(-1) of data collected with the DO detector at the Fermilab Tevatron Collider. We set limits on the production cross section times the branching fraction sigma(p (p) over bar -> X) x B(X -> Z gamma) that range from 0.4 to 3.5 pb at the 95% C.L. for X with invariant masses between 100 and 1000 GeV/c(2), over a wide range of X decay widths. (c) 2006 Elsevier B.V. All rights reserved.

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The e(+)e(-)-->b (B) over bar nu(ν) over bar process, where nu is an electron, muon, or tau-lepton neutrino, is analyzed in detail for the general form of the coupling constant of a Higgs boson with b quarks, with the (m(b)/v)(a + igamma(5)b) parameterization of the Hb (b) over bar interaction. This process is shown to be highly sensitive to this coupling constant. Experiments at the future with roots = 500-GeV linear collider will provide limits of 2 and 20% for deviations of the parameters a and b, respectively, from their Standard Model values. Results concerning the e(+)e(-)-->b (b) over bar nu(ν) over bar process in combination with the independent measurements of the partial width Gamma(H --> b (b) over bar) can testify to the CP origin of the Higgs sector of the theory. (C) 2003 MAIK Nauka/Interperiodica.

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We examine the gamma p photoproduction and the hadronic gamma gamma total cross sections by means of a QCD eikonal model with a dynamical infrared mass scale. In this model, where the dynamical gluon mass is the natural regulator for the tree level gluon-gluon scattering, the gamma p and gamma gamma total cross sections are derived from the pp and (p) over barp forward scattering amplitudes assuming vector meson dominance and the additive quark model. We show that the validity of the cross section factorization relation sigma(pp)/sigma(gamma p)=sigma(gamma p)/sigma(gamma gamma) is fulfilled depending on the Monte Carlo model used to unfold the hadronic gamma gamma cross section data, and we discuss in detail the case of sigma(gamma gamma -> hadrons) data with W-gamma gamma> 10 GeV unfolded by the Monte Carlo generators PYTHIA and PHOJET. The data seems to favor a mild dependence with the energy of the probability (P-had) that the photon interacts as a hadron.

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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Recent studies have shown that the (X) over bar chart with variable sampling intervals (VSI) and/or with variable sample sizes (VSS) detects process shifts faster than the traditional (X) over bar chart. This article extends these studies for processes that are monitored by both the (X) over bar and R charts. A Markov chain model is used to determine the properties of the joint (X) over bar and R charts with variable sample sizes and sampling intervals (VSSI). The VSSI scheme improves the joint (X) over bar and R control chart performance in terms of the speed with which shifts in the process mean and/or variance are detected.

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A Fortran computer program is given for the computation of the adjusted average time to signal, or AATS, for adaptive (X) over bar charts with one, two, or all three design parameters variable: the sample size, n, the sampling interval, h, and the factor k used in determining the width of the action limits. The program calculates the threshold limit to switch the adaptive design parameters and also provides the in-control average time to signal, or ATS.

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An economic-statistical model is developed for variable parameters (VP) (X) over bar charts in which all design parameters vary adaptively, that is, each of the design parameters (sample size, sampling interval and control-limit width) vary as a function of the most recent process information. The cost function due to controlling the process quality through a VP (X) over bar chart is derived. During the optimization of the cost function, constraints are imposed on the expected times to signal when the process is in and out of control. In this way, required statistical properties can be assured. Through a numerical example, the proposed economic-statistical design approach for VP (X) over bar charts is compared to the economic design for VP (X) over bar charts and to the economic-statistical and economic designs for fixed parameters (FP) (X) over bar charts in terms of the operating cost and the expected times to signal. From this example, it is possible to assess the benefits provided by the proposed model. Varying some input parameters, their effect on the optimal cost and on the optimal values of the design parameters was analysed.

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Varying the parameters of the (X) over bar chart has been explored extensively in recent years. In this paper, we extend the study of the (X) over bar chart with variable parameters to include variable action limits. The action limits establish whether the control should be relaxed or not. When the (X) over bar falls near the target, the control is relaxed so that there will be more time before the next sample and/or the next sample will be smaller than usual. When the (X) over bar falls far from the target but not in the action region, the control is tightened so that there is less time before the next sample and/or the next sample will be larger than usual. The goal is to draw the action limits wider than usual when the control is relaxed and narrower than usual when the control is tightened. This new feature then makes the (X) over bar chart more powerful than the CUSUM scheme in detecting shifts in the process mean.

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This paper deals with the joint economic design of (x) over bar and R charts when the occurrence times of assignable causes follow Weibull distributions with increasing failure rates. The variable quality characteristic is assumed to be normally distributed and the process is subject to two independent assignable causes (such as tool wear-out, overheating, or vibration). One cause changes the process mean and the other changes the process variance. However, the occurrence of one kind of assignable cause does not preclude the occurrence of the other. A cost model is developed and a non-uniform sampling interval scheme is adopted. A two-step search procedure is employed to determine the optimum design parameters. Finally, a sensitivity analysis of the model is conducted, and the cost savings associated with the use of non-uniform sampling intervals instead of constant sampling intervals are evaluated.

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When joint (X) over bar and R charts are in use, samples of fixed size are regularly taken from the process, and their means and ranges are plotted on the (X) over bar and R charts, respectively. In this article, joint (X) over bar and R charts have been used for monitoring continuous production processes. The sampling is performed, in two stages. During the first stage, one item of the sample is inspected and, depending on the result, the sampling is interrupted if the process is found to be in control; otherwise, it goes on to the second stage, where the remaining sample items are inspected. The two-stage sampling procedure speeds up the detection of process disturbances. The proposed joint (X) over bar and R charts are easier to administer and are more efficient than the joint (X) over bar and R charts with variable sample size where the quality characteristic of interest can be evaluated either by attribute or variable. Copyright (C) 2004 John Wiley Sons, Ltd.