854 resultados para Precise Positioning
Resumo:
Each mode of a multimode fibre is excited using binary phase patterns on a Spatial Light Modulator and verified by observation of the near-field leaving the fibre and analysis of the step response. © 2011 OSA.
Precise 3D localisation of a cortical thinning defect associated with femoral neck fracture in life.
Resumo:
This paper provides a review of important results concerning the Geometrical Theory of Diffraction and Geometrical Optics. It also reviews the properties of the existing solution for the problem of diffraction of a time harmonic plane wave by a half-plane. New mathematical expressions are derived for the wave fields involved in the problem of diffraction of a time harmonic plane wave by a quarter-plane, including the secondary radiated waves. This leads to a precise representation of the diffraction coefficient describing the diffraction occurring at the corner of the quarter-plane. Our results for the secondary radiated waves are an important step towards finding a formula giving the corner diffraction coefficient everywhere. © 2012 The authors.
Resumo:
We experimentally demonstrate a frequency modulation locked servo loop, locked to a resonance line of an on-chip microdisk resonator in a silicon nitride platform. By using this approach, we demonstrate real-time monitoring of refractive index variations with a precision approaching 10(-7) RIU, using a moderate Q factor of 10(4). The approach can be applied for intensity independent, dynamic and precise index of refraction monitoring for biosensing applications.
Resumo:
Each mode of a multimode fibre is excited using binary phase patterns on a Spatial Light Modulator and verified by observation of the near-field leaving the fibre and analysis of the step response. © 2011 OSA.
Resumo:
A novel method for positioning of InAs islands on GaAs (110) by cleaved edge overgrowth is reported. The first growth sample contains strained InxGa1-xAs/GaAs superlattice (SL) of varying indium fraction, which acts as a strain nanopattern for the cleaved-edge overgrowth. Atoms incident on the cleaved edge will preferentially migrate to InGaAs regions where favorable bonding sites are available. By this method InAs island chains with lateral periodicity defined by the thickness of InGaAs and GaAs of SL have been realized by molecular beam epitaxy (MBE). They are observed by means of atomic force microscopy (AFM). The strain nanopattern's effect is studied by the different indium fraction of SL and MBE growth conditions. (c) 2005 Elsevier B.V. All rights reserved.
Resumo:
Optoelectronic packaging has become a most important factor that influences the final performance and cost of the module. In this paper, low microwave loss coplanar waveguide(CPW) on high resistivity silicon(HRS) and precise V groove in silicon substrate were successfully fabricated. The microwave attenuation of the CPW made on HRS with the simple process is lower than 2 dB/cm in the frequency range of 0 similar to 26GHz, and V groove has the accuracy in micro level and smooth surface. These two techniques built a good foundation for high frequency packaging and passive coupling of the optoelectronic devices. Based on these two techniques, a simple high resistivity silicon substrate that integrated V groove and CPW for flip-chip packaging of lasers was completed. It set a good example for more complicate optoelectronic packaging.
Resumo:
原子核的质量直接反映了核内强相互作用、电磁相互作用和弱相互作用的结果.文章简要阐述了原子核质量测量的意义、现状和主要方法,介绍了基于兰州重离子冷却储存环的原子核质量测量实验,比较了首次得到的63Ge,65As,67Se和71Kr核质量测量值与理论计算结果,探讨了65As质量对天体物理快质子俘获过程的影响,文章最后给出了今后的研究内容.中国科学院近代物理研究所在轻质量丰中子区,系统测量了从Ne到Ca核素的质量,研究了N=20和28幻数随中子数和质子数变化的演化;在丰质子区,精确测量了快质子俘获路径上关键核素的质量,为解释X射线暴等爆发性天体过程提供重要的质量数据;在中重丰中子区,系统地测量丰中子核质量,通过天体网络计算模拟超新星爆发中的快中子俘获过程.
Resumo:
The present paper reports some definite evidence for the significance of wavelength positioning accuracy in multicomponent analysis techniques for the correction of line interferences in inductively coupled plasma atomic emission spectrometry (ICP-AES). Using scanning spectrometers commercially available today, a large relative error, DELTA(A) may occur in the estimated analyte concentration, owing to wavelength positioning errors, unless a procedure for data processing can eliminate the problem of optical instability. The emphasis is on the effect of the positioning error (deltalambda) in a model scan, which is evaluated theoretically and determined experimentally. A quantitative relation between DELTA(A) and deltalambda, the peak distance, and the effective widths of the analysis and interfering lines is established under the assumption of Gaussian line profiles. The agreement between calculated and experimental DELTA(A) is also illustrated. The DELTA(A) originating from deltalambda is independent of the net analyte/interferent signal ratio; this contrasts with the situation for the positioning error (dlambda) in a sample scan, where DELTA(A) decreases with an increase in the ratio. Compared with dlambda, the effect of deltalambda is generally less significant.
Resumo:
The present paper deals with the evaluation of the relative error (DELTA(A)) in estimated analyte concentrations originating from the wavelength positioning error in a sample scan when multicomponent analysis (MCA) techniques are used for correcting line interferences in inductively coupled plasma atomic emission spectrometry. In the theoretical part, a quantitative relation of DELTA(A) with the extent of line overlap, bandwidth and the magnitude of the positioning error is developed under the assumption of Gaussian line profiles. The measurements of eleven samples covering various typical line interferences showed that the calculated DELTA(A) generally agrees well with the experimental one. An expression of the true detection limit associated with MCA techniques was thus formulated. With MCA techniques, the determination of the analyte and interferent concentrations depend on each other while with conventional correction techniques, such as the three-point method, the estimate of interfering signals is independent of the analyte signals. Therefore. a given positioning error results in a larger DELTA(A) and hence a higher true detection limit in the case of MCA techniques than that in the case of conventional correction methods. although the latter could be a reasonable approximation of the former when the peak distance expressed in the effective width of the interfering line is larger than 0.4. In the light of the effect of wavelength positioning errors, MCA techniques have no advantages over conventional correction methods unless the former can bring an essential reduction ot the positioning error.