3 resultados para phonon

em Scielo Saúde Pública - SP


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In this work we describe the synthesis and characterization of chalcogenide glass (0.3La2S3-0.7Ga2S 3) with low phonons frequencies. Several properties were measured like Sellmeier parameters, linear refractive index dispersion and material dispersion. Samples with the composition above were doped with Dy2S3. The absorption and emission characteristics were measured by electronic spectroscopy and fluorescence spectrum respectively. Raman and infrared spectroscopy shows that these glasses present low phonons frequencies and strucuture composed by GaS4 tetrahedrals. The Lines model was used for calculate the coefficients values of the non linear refractive index.

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Optical spectroscopy in the 400-1700nm wavelength range was performed on rare earth doped heavy metal fluoride (HMF) glasses. In the present work In-based fluoride glasses with a fixed 2 mol % YbF3 concentration and an ErF3 content ranging from 0 to 8 mol % were investigated. According to the experimental spectroscopic data a dependence in the absorption coefficient, the photoluminescence intensity and in the radiative lifetime could be verified as a function of the ErF3 content. In addition, at liquid nitrogen temperature, light emission corresponding to indirect transitions in the infrared energy range could be easily observed as a consequence of the low phonon frequency characteristic of this class of fluoride glasses. For all the studied compositions, strong upconversion to the green and red light was observed by pumping these Er3+- and Yb3+-doped HMF glasses with 790 and 980nm photon sources.

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In this report, we studied the thickness effect on the optical and morphological properties of self-assembled (SA) poly(p-phenylenevinylene) (PPV) films, wich were processed with 5 and 75 layers from a PPV precursor polymer and dodecylbenzenesulfonate, and then, thermally converted at 230 °C. The increase of the film thickness yielded more intense peaks in the vibrational spectral range. The electron-phonon coupling was quantified by the Huang - Rhys factor, that shows the effects on the polymer chain mobility in the interface substrate/polymer. A strong emission anisotropy r=0.57 was observed for the film with 5 layers of thickness decreasing to 0.34 for the film with 75 layers. Finally, the surface topology of the films was measured using Atomic Force Microscopy.