Portable architecture

What is the architecture of transience? What role does architecture play in the impermanent context of the nomad? What form does architecture take when our perception of shelter transforms from fixed and static to flexible and transportable? How does architecture react to the challenges of mobility and change? Traditional building forms speak of stability as an important aspect of architecture. Does portability imply a different building form? During the1950s Buckminister Fuller introduced the idea of mobile, portable structures. In the 1960s Archigrams' examples of architectural nomadism made the mobile home an accepted feature of our contemporary landscape. Currently, new materials and new methods of assembly and transportation open opportunities for rethinking portable architecture. For this thesis, a shelter was developed which provides inhabitable space and portability. The shelter was designed to be easily carried as a backpack. With minimum human effort, the structure is assembled and erected in a few minutes. Although this portable shelter needs to be maneuvered, folded and tucked away for transportation, it does meet the demands of nomadic behavior which emphasizes comfort and portability.

Implementation of X-ray diffraction in the measurement of residual thermal strains

Microelectronic systems are multi-material, multi-layer structures, fabricated and exposed to environmental stresses over a wide range of temperatures. Thermal and residual stresses created by thermal mismatches in films and interconnections are a major cause of failure in microelectronic devices. Due to new device materials, increasing die size and the introduction of new materials for enhanced thermal management, differences in thermal expansions of various packaging materials have become exceedingly important and can no longer be neglected. X-ray diffraction is an analytical method using a monochromatic characteristic X-ray beam to characterize the crystal structure of various materials, by measuring the distances between planes in atomic crystalline lattice structures. As a material is strained, this interplanar spacing is correspondingly altered, and this microscopic strain is used to determine the macroscopic strain. This thesis investigates and describes the theory and implementation of X-ray diffraction in the measurement of residual thermal strains. The design of a computer controlled stress attachment stage fully compatible with an Anton Paar heat stage will be detailed. The stress determined by the diffraction method will be compared with bimetallic strip theory and finite element models.