Numerical calculation of diffraction coefficients from building edges using FDTD method

Finite Difference Time Domain (FDTD) Method and software are applied to obtain diffraction waves from modulated Gaussian plane wave illumination for right angle wedges and Fast Fourier Transform (FFT) is used to get diffraction coefficients in a wideband in the illuminated lit region. Theta and Phi polarization in 3-dimensional, TM and TE polarization in 2-dimensional cases are considered respectively for soft and hard diffraction coefficients. Results using FDTD method of perfect electric conductor (PEC) wedge are compared with asymptotic expressions from Uniform Theory of Diffraction (UTD). Extend the PEC wedges to some homogenous conducting and dielectric building materials for diffraction coefficients that are not available analytically in practical conditions. ^

Implementation of X-ray diffraction in the measurement of residual thermal strains

Microelectronic systems are multi-material, multi-layer structures, fabricated and exposed to environmental stresses over a wide range of temperatures. Thermal and residual stresses created by thermal mismatches in films and interconnections are a major cause of failure in microelectronic devices. Due to new device materials, increasing die size and the introduction of new materials for enhanced thermal management, differences in thermal expansions of various packaging materials have become exceedingly important and can no longer be neglected. X-ray diffraction is an analytical method using a monochromatic characteristic X-ray beam to characterize the crystal structure of various materials, by measuring the distances between planes in atomic crystalline lattice structures. As a material is strained, this interplanar spacing is correspondingly altered, and this microscopic strain is used to determine the macroscopic strain. This thesis investigates and describes the theory and implementation of X-ray diffraction in the measurement of residual thermal strains. The design of a computer controlled stress attachment stage fully compatible with an Anton Paar heat stage will be detailed. The stress determined by the diffraction method will be compared with bimetallic strip theory and finite element models.

Determining polarization dependent diffraction coefficients from building edges using FDTD method

Electromagnetic waves in suburban environment encounter multiple obstructions that shadow the signal. These waves are scattered and random in polarization. They take multiple paths that add as vectors at the portable device. Buildings have vertical and horizontal edges. Diffraction from edges has polarization dependent characteristics. In practical case, a signal transmitted from a vertically polarized high antenna will result in a significant fraction of total power in the horizontal polarization at the street level. Signal reception can be improved whenever there is a probability of receiving the signal in at least two independent ways or branches. The Finite-Difference Time-Domain (FDTD) method was applied to obtain the two and three-dimensional dyadic diffraction coefficients (soft and hard) of right-angle perfect electric conductor (PEC) wedges illuminated by a plane wave. The FDTD results were in good agreement with the asymptotic solutions obtained using Uniform Theory of Diffraction (UTD). Further, a material wedge replaced the PEC wedge and the dyadic diffraction coefficient for the same was obtained.