Recent Results on Stability Analysis of an Optimal Assembly Line Balance

Two assembly line balancing problems are addressed. The first problem (called SALBP-1) is to minimize number of linearly ordered stations for processing n partially ordered operations V = {1, 2, ..., n} within the fixed cycle time c. The second problem (called SALBP-2) is to minimize cycle time for processing partially ordered operations V on the fixed set of m linearly ordered stations. The processing time ti of each operation i ∈V is known before solving problems SALBP-1 and SALBP-2. However, during the life cycle of the assembly line the values ti are definitely fixed only for the subset of automated operations V\V . Another subset V ⊆ V includes manual operations, for which it is impossible to fix exact processing times during the whole life cycle of the assembly line. If j ∈V , then operation times tj can differ for different cycles of the production process. For the optimal line balance b of the assembly line with operation times t1, t2, ..., tn, we investigate stability of its optimality with respect to possible variations of the processing times tj of the manual operations j ∈ V .

ROC Curves within the Framework of Neural Network Assembly Memory Model: Some Analytic Results

On the basis of convolutional (Hamming) version of recent Neural Network Assembly Memory Model (NNAMM) for intact two-layer autoassociative Hopfield network optimal receiver operating characteristics (ROCs) have been derived analytically. A method of taking into account explicitly a priori probabilities of alternative hypotheses on the structure of information initiating memory trace retrieval and modified ROCs (mROCs, a posteriori probabilities of correct recall vs. false alarm probability) are introduced. The comparison of empirical and calculated ROCs (or mROCs) demonstrates that they coincide quantitatively and in this way intensities of cues used in appropriate experiments may be estimated. It has been found that basic ROC properties which are one of experimental findings underpinning dual-process models of recognition memory can be explained within our one-factor NNAMM.