1 resultado para Epitaxy, Silicon, Surface measurements, Carbides, Plasma materials processing
em Bulgarian Digital Mathematics Library at IMI-BAS
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Resumo:
A vision system is applied to full-field displacements and deformation measurements in solid mechanics. A speckle like pattern is preliminary formed on the surface under investigation. To determine displacements field of one speckle image with respect to a reference speckle image, sub-images, referred to Zones Of Interest (ZOI) are considered. The field is obtained by matching a ZOI in the reference image with the respective ZOI in the moved image. Two image processing techniques are used for implementing the matching procedure: – cross correlation function and minimum mean square error (MMSE) of the ZOI intensity distribution. The two algorithms are compared and the influence of the ZOI size on the accuracy of measurements is studied.