10 resultados para diffraction gratings
em Aston University Research Archive
Resumo:
A novel highly efficient, fiber-compatible spectrally encoded imaging (SEI) system using a 45° tilted fiber grating (TFG) is proposed and experimentally demonstrated for the first time, to the best of our knowledge. The TFG serves as an in-fiber lateral diffraction element, eliminating the need for bulky and lossy free-space diffraction gratings in conventional SEI systems. Under proper polarization control, due to the strong tilted reflection, the 45° TFG offers a diffraction efficiency as high as 93.5%. Our new design significantly reduces the volume of the SEI system and improves energy efficiency and system stability. As a proof-ofprinciple experiment, spectrally encoded imaging of a customer-designed sample (9.6 mm x 3.0 mm) using the TFG-based system is demonstrated. The lateral resolution of the SEI system is measured to be 42 μm in our experiment.
Resumo:
We propose and demonstrate, for the first time to our best knowledge, the use of a 45° tilted fiber grating (TFG) as an infiber lateral diffraction element in an efficient and fiber-compatible spectrally encoded imaging (SEI) system. Under proper polarization control, the TFG has significantly enhanced diffraction efficiency (93.5%) due to strong tilted reflection. Our conceptually new fiber-topics-based design eliminates the need for bulky and lossy free-space diffraction gratings, significantly reduces the volume and cost of the imaging system, improves energy efficiency, and increases system stability. As a proof-of-principle experiment, we use the proposed system to perform an one dimensional (1D) line scan imaging of a customer-designed three-slot sample and the results show that the constructed image matches well with the actual sample. The angular dispersion of the 45° TFG is measured to be 0.054°/nm and the lateral resolution of the SEI system is measured to be 28 μm in our experiment.
Resumo:
A method of discriminating between temperature and strain effects in fibre sensing using a conventionally written, in-fibre Bragg grating is presented. The technique uses wavelength information from the first and second diffraction orders of the grating element to determine the wavelength dependent strain and temperature coefficients, from which independent temperature and strain measurements can be made. The authors present results that validate this matrix inversion technique and quantify the strain and temperature errors which can arise for a given uncertainty in the measurement of the reflected wavelength.
Resumo:
A method of discriminating between temperature and strain effects in fibre sensing using a conventionally written, in-fibre Bragg grating is presented. The technique uses wavelength information from the first and second diffraction orders of the grating element to determine the wavelength dependent strain and temperature coefficients, from which independent temperature and strain measurements can be made. The authors present results that validate this matrix inversion technique and quantify the strain and temperature errors which can arise for a given uncertainty in the measurement of the reflected wavelength.
Resumo:
The fabrication of sub-micron periodic structures beyond diffraction limit is a major motivation for the present paper. We describe the fabrication of the periodic structure of 25 mm long with a pitch size of 260 nm which is less than a third of the wavelength used. This is the smallest reported period of the periodic structure inscribed by direct point-by-point method. A prototype of the add-drop filter, which utilizes such gratings, was demonstrated in one stage fabrication process of femtosecond inscription, in the bulk fused silica.
Resumo:
The fabrication of sub-micron periodic structures beyond diffraction limit is a major motivation for the present paper. We describe the fabrication of the periodic structure of 25 mm long with a pitch size of 260 nm which is less than a third of the wavelength used. This is the smallest reported period of the periodic structure inscribed by direct point-by-point method. A prototype of the add-drop filter, which utilizes such gratings, was demonstrated in one stage fabrication process of femtosecond inscription, in the bulk fused silica.
Resumo:
We have UV-inscribed and theoretically and experimentally analyzed fiber gratings with the structure tilted at 45° and implemented this type of devices as an in-fiber polarizer. A systematic investigation has been carried out on the characterization of 45° tilted fiber gratings (45° TFGs) in terms of the polarization-dependant loss (PDL) and thermal response. The detailed theoretical modeling has revealed a linear correlation between the grating length and the PDL, which has been proved by the experimental results. For the first time, we have examined the UV beam diffraction from a tilted phase mask and designed the UV-inscription system to suit the 45° TFG fabrication. Experimentally, a 24 mm long 45° TFG UV-inscribed in standard telecom single-mode fiber exhibited around 25 dB PDL at 1530 nm and an over ~300 nm bandwidth of PDL spectrum. By the concatenation method, a 44 mm long grating showed a PDL as high as 40 dB that is close to the high polarization extinction ratio of commercial products. Moreover, we have revealed that the PDL of 45° TFGs has low thermal influence, which is desirable for real application devices. Finally, we experimentally demonstrated an all-fiber twist sensor system based on a 45° and an 81° TFG.
Resumo:
We have UV-inscribed and theoretically and experimentally analyzed fiber gratings with the structure tilted at 45° and implemented this type of devices as an in-fiber polarizer. A systematic investigation has been carried out on the characterization of 45° tilted fiber gratings (45° TFGs) in terms of the polarization-dependant loss (PDL) and thermal response. The detailed theoretical modeling has revealed a linear correlation between the grating length and the PDL, which has been proved by the experimental results. For the first time, we have examined the UV beam diffraction from a tilted phase mask and designed the UV-inscription system to suit the 45° TFG fabrication. Experimentally, a 24 mm long 45° TFG UV-inscribed in standard telecom single-mode fiber exhibited around 25 dB PDL at 1530 nm and an over ~300 nm bandwidth of PDL spectrum. By the concatenation method, a 44 mm long grating showed a PDL as high as 40 dB that is close to the high polarization extinction ratio of commercial products. Moreover, we have revealed that the PDL of 45° TFGs has low thermal influence, which is desirable for real application devices. Finally, we experimentally demonstrated an all-fiber twist sensor system based on a 45° and an 81° TFG.
Resumo:
We present the results of femtosecond laser microstructuring of optical fibres by direct access of the fibre end face, both at the surface and several hundred microns into the fibre, to realise one-and two-dimensional grating structures and optical fibre splitters, respectively. We show the versatility of this simple but effective inscription method, where we demonstrate classic multiple slit diffraction patterns and show the potential for coarse wavelength division multiplexing for sensor signals. A key advantage for the fibre splitter is that the inscription method avoids the use of oil immersion that compensate for the fibre curvature in the standard side writing method. © 2012 SPIE.
Resumo:
We report here for the first time the fabrication and characterisation of long-period fibre gratings (LPFGs) with period size up to several millimetres. The resonant loss peaks of these ultra-long-period gratings are generated from the coupling of the forward propagating core mode to the cladding modes of fundamental and harmonic orders. The dependence of temperature sensitivity of the coupled cladding modes on the diffraction order has been investigated. The possibility of utilising resonant peaks of different diffraction orders to perform simultaneous multi-parameter measurement has been explored. © 2002 Elsevier Science B.V. All rights reserved.