Surface roughness reduction and diffraction efficiency optimisation for e-beam written phase masks

We report the control of surface relief grating parameters and roughness for phase masks produced using e-beam lithography (EBL) and reactive ion etching (RIE). The relationships between processing conditions, grating parameters, surface roughness and the diffraction efficiency of the zeroth and the two first order transmitted beams are discussed.

Surface roughness reduction and diffraction efficiency optimisation for e-beam written phase masks

We report the control of surface relief grating parameters and roughness for phase masks produced using e-beam lithography (EBL) and reactive ion etching (RIE). The relationships between processing conditions, grating parameters, surface roughness and the diffraction efficiency of the zeroth and the two first order transmitted beams are discussed.

Exact solution of the Bragg-diffraction problem in sillenites

A method for the exact solution of the Bragg-difrraction problem for a photorefractive grating in sillenite crystals based on Pauli matrices is proposed. For the two main optical configurations explicit analytical expressions are found for the diffraction efficiency and the polarization of the scattered wave. The exact solution is applied to a detailed analysis of a number of particular cases. For the known limiting cases there is agreement with the published results.

Exact solution of the Bragg-diffraction problem in sillenites

A method for the exact solution of the Bragg-difrraction problem for a photorefractive grating in sillenite crystals based on Pauli matrices is proposed. For the two main optical configurations explicit analytical expressions are found for the diffraction efficiency and the polarization of the scattered wave. The exact solution is applied to a detailed analysis of a number of particular cases. For the known limiting cases there is agreement with the published results.

Highly efficient spectrally encoded imaging using a 45° tilted fiber grating

A novel highly efficient, fiber-compatible spectrally encoded imaging (SEI) system using a 45° tilted fiber grating (TFG) is proposed and experimentally demonstrated for the first time, to the best of our knowledge. The TFG serves as an in-fiber lateral diffraction element, eliminating the need for bulky and lossy free-space diffraction gratings in conventional SEI systems. Under proper polarization control, due to the strong tilted reflection, the 45° TFG offers a diffraction efficiency as high as 93.5%. Our new design significantly reduces the volume of the SEI system and improves energy efficiency and system stability. As a proof-ofprinciple experiment, spectrally encoded imaging of a customer-designed sample (9.6 mm x 3.0 mm) using the TFG-based system is demonstrated. The lateral resolution of the SEI system is measured to be 42 μm in our experiment.

A fiber-compatible spectrally encoded imaging system using a 45° tilted fiber grating

We propose and demonstrate, for the first time to our best knowledge, the use of a 45° tilted fiber grating (TFG) as an infiber lateral diffraction element in an efficient and fiber-compatible spectrally encoded imaging (SEI) system. Under proper polarization control, the TFG has significantly enhanced diffraction efficiency (93.5%) due to strong tilted reflection. Our conceptually new fiber-topics-based design eliminates the need for bulky and lossy free-space diffraction gratings, significantly reduces the volume and cost of the imaging system, improves energy efficiency, and increases system stability. As a proof-of-principle experiment, we use the proposed system to perform an one dimensional (1D) line scan imaging of a customer-designed three-slot sample and the results show that the constructed image matches well with the actual sample. The angular dispersion of the 45° TFG is measured to be 0.054°/nm and the lateral resolution of the SEI system is measured to be 28 μm in our experiment.