Measurement of residual stress by load and depth sensing indentation with spherical indenters

A new experimental technique is presented for making measurements of biaxial residual stress using load and depth sensing indentation (nanoindentation). The technique is based on spherical indentation, which, in certain deformation regimes, can be much more sensitive to residual stress than indentation with sharp pyramidal indenters like the Berkovich. Two different methods of analysis were developed: one requiring an independent measure of the material's yield strength and the other a reference specimen in the unstressed state or other known reference condition. Experiments conducted on aluminum alloys to which controlled biaxial bending stresses were applied showed that the methods are capable of measuring the residual stress to within 10-20% of the specimen yield stress. Because the methods do not require imaging of the hardness impressions, they are potentially useful for making localized measurements of residual stress, as in thin films or small volumes, or for characterization of point-to-point spatial variations of the surface stress.

Indentation of elastically anisotropic half-spaces by cones and parabolae of revolution

Indentation of ceramic materials with smooth indenters such as parabolae of revolution and spheres can be conducted in the elastic regime to relatively high loads. Ceramic single crystals thus provide excellent calibration media for load-and depth-sensing indentation testing; however, they are generally anisotropic and a complete elastic analysis is cumbersome. This study presents a simplified procedure for the determination of the stiffness of contact for the indentation of an anisotropic half-space by a rigid frictionless parabola of revolution which, to first order, approximates spherical indentation. Using a similar approach, a new procedure is developed for analysing conical indentation of anisotropic elastic media. For both indenter shapes, the contact is found to be elliptical, and equations are determined for the size, shape and orientation of the ellipse and the indentation modulus.