4 resultados para Thin-plate spline analysis

em AMS Tesi di Laurea - Alm@DL - Università di Bologna


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In Airbus GmbH (Hamburg) has been developed a new design of Rear Pressure Bulkhead (RPB) for the A320-family. The new model has been formed with vacuum forming technology. During this process the wrinkling phenomenon occurs. In this thesis is described an analytical model for prediction of wrinkling based on the energetic method of Timoshenko. Large deflection theory has been used for analyze two cases of study: a simply supported circular thin plate stamped by a spherical punch and a simply supported circular thin plate formed with vacuum forming technique. If the edges are free to displace radially, thin plates will develop radial wrinkles near the edge at a central deflection approximately equal to four plate thicknesses w0/ℎ≈4 if they’re stamped by a spherical punch and w0/ℎ≈3 if they’re formed with vacuum forming technique. Initially, there are four symmetrical wrinkles, but the number increases if the central deflection is increased. By using experimental results, the “Snaptrhough” phenomenon is described.

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Shell structure is widely used in engineering area. The purpose of this dissertation is to show the behavior of a thin shell under external load, especially for long cylindrical shell under compressive load, I analyzed not only for linear elastic problem and also for buckling problem, and by using finite element analysis it shows that the imperfection of a cylinder could affect the critical load which means the buckling capability of this cylinder. For linear elastic problem, I compared the theoretical results with the results got from Straus7 and Abaqus, and the results are really close. For the buckling problem I did the same: compared the theoretical and Abaqus results, the error is less than 1%, but in reality, it’s not possible to reach the theoretical buckling capability due to the imperfection of the cylinder, so I put different imperfection for the cylinder in Abaqus, and found out that with the increasing of the percentage of imperfection, the buckling capability decreases, for example 10% imperfection could decrease 40% of the buckling capability, and the outcome meet the buckling behavior in reality.

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The thesis is mainly focused on the pre-edge analysis of XAS spectra of Ti HCF sample hexacyanocobaltate and hexacyanoferrate samples doped on a Indium Tin Oxide (ITO) thin film. The work is aimed at the determination of Ti oxidation state, as well as indication of various coordination number in the studied samples. The experiment have been conducted using XAFS (X-ray absorption fine structure)beamline at Elettra synchrotron, Trieste (Italy) under supervision of Professor Marco Giorgetti, Department of Industrial Chemistry, University of Bologna. The Master thesis accreditation to fullfill the ASC Master of Advanced Spectroscopy in Chemistry Degree requirement.

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In the last years technologies related to photovoltaic energy have rapidly developed and the interest on renewable energy power source substantially increased. In particular, cost reduction and appropriate feed-in tariff contributed to the increase of photovoltaic installation, especially in Germany and Italy. However, for several technologies, the observed experimental efficiency of solar cells is still far from the theoretical maximum efficiency, and thus there is still room for improvement. In this framework the research and development of new materials and new solar devices is mandatory. In this thesis the morphological and optical properties of thin films of nanocrystalline silicon oxynitride (nc-SiON) have been investigated. This material has been studied in view of its application in Si based heterojunction solar cells (HIT). Actually, a-Si:H is used now in these cells as emitter layer. Amorphous SiO_x N_y has already shown excellent properties, such as: electrical conductivity, optical energy gap and transmittance higher than the ones of a-Si:H. Nc-SiO_x N_y has never been investigated up to now, but its properties can surpass the ones of amorphous SiON. The films of nc-SiON have been deposited at the University of Konstanz (Germany). The properties of these films have been studied using of atomic force microscopy and optical spectroscopy methods. This material is highly complex as it is made by different coexisting phases. The main purpose of this thesis is the development of methods for the analyses of morphological and optical properties of nc-SiON and the study of the reliability of those methods to the measurement of the characteristics of these silicon films. The collected data will be used to understand the evolution of the properties of nc-SiON, as a function of the deposition parameters. The results here obtained show that nc-SiON films have better properties with respect to both a-Si:H and a-SiON, i. e. higher optical band-gap and transmittance. In addition, the analysis of the variation of the observed properties as a function of the deposition parameters allows for the optimization of deposition conditions for obtaining optimal efficiency of a HIT cell with SiON layer.