3 resultados para Selected area electron diffraction (SAED)
em AMS Tesi di Laurea - Alm@DL - Università di Bologna
Resumo:
Il silicio, materiale di base per la realizzazione di gran parte dei dispositivi microelettronici, non trova largo impiego in fotonica principalmente a causa delle sue proprietà elettromagnetiche: oltre ad un band-gap indiretto, il silicio presenta difatti una elevata simmetria reticolare che non permette la presenza di alcuni effetti, come quello elettro-ottico, che sono invece utilmente sfruttati in altri materiali per la fotonica. E’ stato recentemente dimostrato che la deformazione indotta dalla deposizione di film ad alto stress intrinseco potrebbe indurre alcuni di questi effetti, rompendo le simmetrie della struttura. In questo lavoro di tesi viene studiata, mediante simulazioni, microfabbricazione di dispositivi, e caratterizzazione sperimentale, la deformazione reticolare indotta su strutture di tipo ridge micrometriche in silicio mediante deposizione di un film di Si3N4. La deformazione e’ stata analizzata tramite simulazione, utilizzando il metodo agli elementi finiti ed analisi di strain tramite la tecnica di microscopia ottica a trasmissione Convergent-Beam Electron Diffraction. Questa tecnica permette di ottenere delle mappe 2D di strain con risoluzione spaziale micrometrica e sensibilita’ dell’ordine di 100microstrain. Il confronto fra le simulazioni e le misure ha messo in evidenza un accordo quantitativo fra le due analisi, da una parte confermando la validità del modello numerico utilizzato e dall’altro verificando l’accuratezza della tecnica di misura, impiegata innovativamente su strutture di questo tipo. Si sono inoltre stimate le grandezze ottiche: birifrangenza e variazione dell’indice di rifrazione efficace rispetto al caso deformato.di una guida SOI su cui e’ deposto uno strato di nituro. I valori stimati, per uno spessore di 350 nm sono rispettivamente di 0.014 e -0.00475. Questi valori lasciano credere che la tecnologia sia promettente, e che un’evoluzione nei processi di fabbricazione in grado migliorare il controllo delle deformazione potrebbe aprire la strada ad un utilizzo del silicio deformato nella realizzazione di dispositivi ottici ed elettro-ottici.
Resumo:
This work describes the synthesis of a propargylcarbamate-functionalized isophthalate ligand and its use in the solvothermal preparation of a new copper(II)-based metal organic framework named [Cu(1,3-YBDC)]ˑxH2O (also abbreviated as Cu-MOF. The characterization of this compound was performed using several complementary techniques such as infrared (ATR-FTIR) and Raman spectroscopy, X-ray powder diffraction spectroscopy (PXRD), scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), atomic absorption spectroscopy (AAS) as well as thermal and surface area measurements. Synchrotron X-ray diffraction analysis revealed that this MOF contains a complex network of 5-substituted isophthalate anions bound to Cu(II) centers, arranged in pairs within paddlewheel (or “Chinese lantern”) structure with a short Cu…Cu distance of 2.633 Å. Quite unexpectedly, the apical atom in the paddlewheel structure belongs to the carbamate carbonyl oxygen atom. Such extra coordination by the propargylcarbamate groups drastically reduces the MOF porosity, a feature that was also confirmed by BET measurements. Indeed, its surface area was determined to be low (14.5 ± 0.8 m2/g) as its total pore volume (46 mm3/g). Successively the Cu-MOF was treated with HAuCl4 with the aim of studying the ability of the propargylcarbamate functionality to capture the Au(III) ion and reduce it to Au(0) to give gold nanoparticles (AuNPs). The overall amount of gold retained by the Cu-MOF/Au was determined by AAS while the amount of gold and its oxidation state on the surface of the MOF was studied by XPS. A glassy carbon (GC) electrode was drop-casted with a Cu-MOF suspension to electrochemically characterize the material through cyclic voltammetry (CV) and electrochemical impedance spectroscopy (EIS). The performance of the modified electrodes towards nitrite oxidation was tested by CV and chronoamperometry.
Resumo:
The surface of the Earth is subjected to vertical deformations caused by geophysical and geological processes which can be monitored by Global Positioning System (GPS) observations. The purpose of this work is to investigate GPS height time series to identify interannual signals affecting the Earth’s surface over the European and Mediterranean area, during the period 2001-2019. Thirty-six homogeneously distributed GPS stations were selected from the online dataset made available by the Nevada Geodetic Laboratory (NGL) on the basis of the length and quality of the data series. The Principal Component Analysis (PCA) is the technique applied to extract the main patterns of the space and time variability of the GPS Up coordinate. The time series were studied by means of a frequency analysis using a periodogram and the real-valued Morlet wavelet. The periodogram is used to identify the dominant frequencies and the spectral density of the investigated signals; the second one is applied to identify the signals in the time domain and the relevant periodicities. This study has identified, over European and Mediterranean area, the presence of interannual non-linear signals with a period of 2-to-4 years, possibly related to atmospheric and hydrological loading displacements and to climate phenomena, such as El Niño Southern Oscillation (ENSO). A clear signal with a period of about six years is present in the vertical component of the GPS time series, likely explainable by the gravitational coupling between the Earth’s mantle and the inner core. Moreover, signals with a period in the order of 8-9 years, might be explained by mantle-inner core gravity coupling and the cycle of the lunar perigee, and a signal of 18.6 years, likely associated to lunar nodal cycle, were identified through the wavelet spectrum. However, these last two signals need further confirmation because the present length of the GPS time series is still too short when compared to the periods involved.