The effect of temperature on pressure tolerance of the shallow-water shrimp Palaemon serratus

Tolerance to low temperature and high pressure may allow shallow-water species to extend bathymetric range in response to changing climate, but adaptation to contrasting shallow-water environments may affect tolerance to these factors. The brackish shallow-water shrimp Palaemon varians demonstrates remarkable tolerance to elevated hydrostatic pressure and low temperature, but inhabits a highly variable environment: environmental adaptation may therefore make P. varians tolerances unrepresentative of other shallow-water species. Critical thermal maximum (CTmax), critical hydrostatic pressure maximum (CPmax), and acute respiratory response to hydrostatic pressure were assessed in the shallow-water shrimp Palaemon serratus, which inhabits a more stable intertidal habitat. P. serratus’ CTmax was 22.3°C when acclimated at 10°C, and CPmax was 5.9, 10.1, and 14.1 MPa when acclimated at 5, 10, and 15°C respectively: these critical tolerances were consistently lower than P. varians. Respiratory responses to acute hyperbaric exposures similarly indicated lower tolerance to hydrostatic pressure in P. serratus than in P. varians. Contrasting tolerances likely reflect physiological adaptation to differing environments and reveal that the capacity for depth-range extension may vary among species from different habitats.

In-situ detection of defect formation in organic flexible electronics by Kelvin Probe Force Microscopy

Organic semiconductor technology has attracted considerable research interest in view of its great promise for large area, lightweight, and flexible electronics applications. Owing to their advantages in processing and unique physical properties, organic semiconductors can bring exciting new opportunities for broad-impact applications requiring large area coverage, mechanical flexibility, low-temperature processing, and low cost. In order to achieve highly flexible device architecture it is crucial to understand on a microscopic scale how mechanical deformation affects the electrical performance of organic thin film devices. Towards this aim, I established in this thesis the experimental technique of Kelvin Probe Force Microscopy (KPFM) as a tool to investigate the morphology and the surface potential of organic semiconducting thin films under mechanical strain. KPFM has been employed to investigate the strain response of two different Organic Thin Film Transistor with active layer made by 6,13-bis(triisopropylsilylethynyl)-pentacene (TIPS-Pentacene), and Poly(3-hexylthiophene-2,5-diyl) (P3HT). The results show that this technique allows to investigate on a microscopic scale failure of flexible TFT with this kind of materials during bending. I find that the abrupt reduction of TIPS-pentacene device performance at critical bending radii is related to the formation of nano-cracks in the microcrystal morphology, easily identified due to the abrupt variation in surface potential caused by local increase in resistance. Numerical simulation of the bending mechanics of the transistor structure further identifies the mechanical strain exerted on the TIPS-pentacene micro-crystals as the fundamental origin of fracture. Instead for P3HT based transistors no significant reduction in electrical performance is observed during bending. This finding is attributed to the amorphous nature of the polymer giving rise to an elastic response without the occurrence of crack formation.