3 resultados para Direction of measurement properties.
em AMS Tesi di Laurea - Alm@DL - Università di Bologna
Resumo:
RTLS and RFID systems are becoming more and more important in several fields. When these systems meet the UWB technology, they can take advantage of each other strengths. Since nowadays a strong importance is given to the "green" technology, we chose to adopt a passive solution. In this case the backscattering modulation can be used to carry data. Therefore it is necessary to analyze the behavior of the antennas used as tags, when they are closed to dierent material objects. In particular, the antenna mode part has been deeply observed, as it is the crucial part of the signal regarding the backscatter modulation.
Resumo:
The assessment of historical structures is a significant need for the next generations, as historical monuments represent the community’s identity and have an important cultural value to society. Most of historical structures built by using masonry which is one of the oldest and most common construction materials used in the building sector since the ancient time. Also it is considered a complex material, as it is a composition of brick units and mortar, which affects the structural performance of the building by having different mechanical behaviour with respect to different geometry and qualities given by the components.
Resumo:
In the last years technologies related to photovoltaic energy have rapidly developed and the interest on renewable energy power source substantially increased. In particular, cost reduction and appropriate feed-in tariff contributed to the increase of photovoltaic installation, especially in Germany and Italy. However, for several technologies, the observed experimental efficiency of solar cells is still far from the theoretical maximum efficiency, and thus there is still room for improvement. In this framework the research and development of new materials and new solar devices is mandatory. In this thesis the morphological and optical properties of thin films of nanocrystalline silicon oxynitride (nc-SiON) have been investigated. This material has been studied in view of its application in Si based heterojunction solar cells (HIT). Actually, a-Si:H is used now in these cells as emitter layer. Amorphous SiO_x N_y has already shown excellent properties, such as: electrical conductivity, optical energy gap and transmittance higher than the ones of a-Si:H. Nc-SiO_x N_y has never been investigated up to now, but its properties can surpass the ones of amorphous SiON. The films of nc-SiON have been deposited at the University of Konstanz (Germany). The properties of these films have been studied using of atomic force microscopy and optical spectroscopy methods. This material is highly complex as it is made by different coexisting phases. The main purpose of this thesis is the development of methods for the analyses of morphological and optical properties of nc-SiON and the study of the reliability of those methods to the measurement of the characteristics of these silicon films. The collected data will be used to understand the evolution of the properties of nc-SiON, as a function of the deposition parameters. The results here obtained show that nc-SiON films have better properties with respect to both a-Si:H and a-SiON, i. e. higher optical band-gap and transmittance. In addition, the analysis of the variation of the observed properties as a function of the deposition parameters allows for the optimization of deposition conditions for obtaining optimal efficiency of a HIT cell with SiON layer.