4 resultados para X-ray photoelectron spectral analysis
em AMS Tesi di Dottorato - Alm@DL - Università di Bologna
Resumo:
The thesis is dedicated to the implementation of advanced x-ray-based techniques for the investigation of the battery systems, more predominantly, the cathode materials. The implemented characterisation methods include synchrotron based x-ray absorption spectroscopy, powder x-ray diffraction, 2-dimensional x-ray fluorescence, full field transmission soft x-ray microscopy, and laboratory x-ray photoelectron spectroscopy. The research highlights the different areas of expertise for each described method, in terms of material characterisation, exploring their complementarities and intersections. The results are focused over manganese hexacyanoferrate and partially Ni substituted manganese hexacyanoferrate, through both organic and aqueous battery systems. In aqueous system, the modification of cathode composition has been observed with various techniques, indicating to the processes occurring in bulk, surface, locally or in long-range, including with the speciation by 2-dimensional scanning, and the time-resolution, by the implementation of the operando measurements. In organic media, the inhomogenisation of the cathode material during the aging process was investigated by the development of the special image treatment procedure for the maps, obtained from the transmission soft x-ray microscopy. It worth mentioning, that apart from the combination of the outcomes from the various x-ray measurements, the exploration of the new capabilities was also conducted, namely, probing the oxidation state of the element with the synchrotron-based 2-dimensional x-ray fluorescence technique, which, generally, with conventional set up, is not possible to achieve. The results and methodology from this thesis can, of course, be generalised on the characterisation of the other battery systems, and not only, as the x-ray techniques are one of the most informative and sophisticated methods for advanced structural investigation of the materials.
Resumo:
Seyfert galaxies are the closest active galactic nuclei. As such, we can use
them to test the physical properties of the entire class of objects. To investigate
their general properties, I took advantage of different methods of data analysis. In
particular I used three different samples of objects, that, despite frequent overlaps,
have been chosen to best tackle different topics: the heterogeneous BeppoS AX
sample was thought to be optimized to test the average hard X-ray (E above 10 keV)
properties of nearby Seyfert galaxies; the X-CfA was thought the be optimized to
compare the properties of low-luminosity sources to the ones of higher luminosity
and, thus, it was also used to test the emission mechanism models; finally, the
XMM–Newton sample was extracted from the X-CfA sample so as to ensure a
truly unbiased and well defined sample of objects to define the average properties
of Seyfert galaxies.
Taking advantage of the broad-band coverage of the BeppoS AX MECS and
PDS instruments (between ~2-100 keV), I infer the average X-ray spectral propertiesof nearby Seyfert galaxies and in particular the photon index (
Resumo:
This Thesis focuses on the X-ray study of the inner regions of Active Galactic Nuclei, in particular on the formation of high velocity winds by the accretion disk itself. Constraining AGN winds physical parameters is of paramount importance both for understanding the physics of the accretion/ejection flow onto supermassive black holes, and for quantifying the amount of feedback between the SMBH and its environment across the cosmic time. The sources selected for the present study are BAL, mini-BAL, and NAL QSOs, known to host high-velocity winds associated to the AGN nuclear regions. Observationally, a three-fold strategy has been adopted: - substantial samples of distant sources have been analyzed through spectral, photometric, and statistical techniques, to gain insights into their mean properties as a population; - a moderately sized sample of bright sources has been studied through detailed X-ray spectral analysis, to give a first flavor of the general spectral properties of these sources, also from a temporally resolved point of view; - the best nearby candidate has been thoroughly studied using the most sophisticated spectral analysis techniques applied to a large dataset with a high S/N ratio, to understand the details of the physics of its accretion/ejection flow. There are three main channels through which this Thesis has been developed: - [Archival Studies]: the XMM-Newton public archival data has been extensively used to analyze both a large sample of distant BAL QSOs, and several individual bright sources, either BAL, mini-BAL, or NAL QSOs. - [New Observational Campaign]: I proposed and was awarded with new X-ray pointings of the mini-BAL QSOs PG 1126-041 and PG 1351+640 during the XMM-Newton AO-7 and AO-8. These produced the biggest X-ray observational campaign ever made on a mini-BAL QSO (PG 1126-041), including the longest exposure so far. Thanks to the exceptional dataset, a whealth of informations have been obtained on both the intrinsic continuum and on the complex reprocessing media that happen to be in the inner regions of this AGN. Furthermore, the temporally resolved X-ray spectral analysis field has been finally opened for mini-BAL QSOs. - [Theoretical Studies]: some issues about the connection between theories and observations of AGN accretion disk winds have been investigated, through theoretical arguments and synthetic absorption line profiles studies.
Resumo:
This thesis work is focused on the use of selected core-level x-ray spectroscopies to study semiconductor materials of great technological interest and on the development of a new implementation of appearance potential spectroscopy. Core-level spectroscopies can be exploited to study these materials with a local approach since they are sensitive to the electronic structure localized on a chemical species present in the sample examined. This approach, in fact, provides important micro-structural information that is difficult to obtain with techniques sensitive to the average properties of materials. In this thesis work we present a novel approach to the study of semiconductors with core-level spectroscopies based on an original analysis procedure that leads to an insightful understanding of the correlation between the local micro-structure and the spectral features observed. In particular, we studied the micro-structure of Hydrogen induced defects in nitride semiconductors, since the analysed materials show substantial variations of optical and electronic properties as a consequence of H incorporation. Finally, we present a novel implementation of soft x-ray appearance potential spectroscopy, a core-level spectroscopy that uses electrons as a source of excitation and has the great advantage of being an in-house technique. The original set-up illustrated was designed to reach a high signal-to-noise ratio for the acquisition of good quality spectra that can then be analyzed in the framework of the real space full multiple scattering theory. This technique has never been coupled with this analysis approach and therefore our work unite a novel implementation with an original data analysis method, enlarging the field of application of this technique.